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Your search for Debashis Bhattacharya

  1. Cover: Hierarchical Modeling for VLSI Circuit Testing - Springer
    Debashis Bhattacharya | John P. Hayes
    Hierarchical Modeling for VLSI Circuit Testing
    12/2012
    Springer
    9781461315278 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  2. Cover: Hierarchical Modeling for VLSI Circuit Testing - Springer
    Debashis Bhattacharya | John P. Hayes
    Hierarchical Modeling for VLSI Circuit Testing
    09/2011
    Springer
    9781461288190 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €106.99
    Shipment within 15-20 days
  3. Cover: Hierarchical Modeling for VLSI Circuit Testing - Kluwer Academic Publishers
    Debashis Bhattacharya | John P. Hayes
    Hierarchical Modeling for VLSI Circuit Testing
    12/1989
    Kluwer Academic Publishers
    9780792390589 (ISBN)
    Book
    Hardback
    Other editions
    €106.99
    Shipment within 15-20 days
  4. Cover: Hierarchical Modeling for VLSI Circuit Testing - Springer
    Debashis Bhattacharya | John P Hayes
    Hierarchical Modeling for VLSI Circuit Testing
    12/1989
    Springer
    9781461315285 (ISBN)
    Book
    Paperback/Softback
    €42.99
    Not available