12 results
Type of media (2)
Availability (2)
Classification (4)
Year
Persons
Publishers
Sort by
Results per page
Filter
12 results

Your search for David G. Seiler

  1. Cover: Metrology and Diagnostic Techniques for Nanoelectronics - Routledge
    Zhiyong Ma | David G. Seiler
    Metrology and Diagnostic Techniques for Nanoelectronics
    03/2017
    Routledge
    9781351733953 (ISBN)
    E-Book
    PDF
    Other editions
    €443.99
    Available for download
  2. Cover: Metrology and Diagnostic Techniques for Nanoelectronics - Routledge
    Zhiyong Ma | David G. Seiler
    Metrology and Diagnostic Techniques for Nanoelectronics
    03/2017
    1st EDN1st Edition
    Routledge
    9781351733946 (ISBN)
    E-Book
    ePUB
    Other editions
    €443.99
    Available for download
  3. Cover: Metrology and Diagnostic Techniques for Nanoelectronics - Pan Stanford Publishing Pte Ltd
    Zhiyong Ma | David G. Seiler
    Metrology and Diagnostic Techniques for Nanoelectronics
    10/2016
    Pan Stanford Publishing Pte Ltd
    9789814745086 (ISBN)
    Book
    Hardback
    Other editions
    €497.66
    Shipment within 3-4 weeks
  4. Cover: Frontiers of Characterization and Metrology for Nanoelectronics - American Institute of Physics
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics
    2009
    11/2009
    1st EDN1st Edition
    American Institute of Physics
    9780735407121 (ISBN)
    Book
    Hardback
    €199.72
    No shipping information available
  5. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics: 2011
    04/2012
    1st EDN1st Edition
    American Institute of Physics
    9780735409736 (ISBN)
    Book
    Mixed media product
    €171.15
    The article will not be published
  6. This image is currently not available.
    Robert K. Willardson | Albert C. Beer | Eicke R. Weber
    Semiconductors and Semimetals: Spectroscopy of Semiconductors v.36
    07/1992
    Academic Press
    9780127521367 (ISBN)
    Book
    Hardback
    Other editions
    €160.94
    Exhausted; check different version
  7. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics
    2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
    10/2007
    1st EDN1st Edition
    American Institute of Physics
    9780735404410 (ISBN)
    Book
    Mixed media product
    €147.50
    No shipping information available
  8. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Characterization and Metrology for ULSI Technology 2005
    11/2005
    1st EDN1st Edition
    American Institute of Physics
    9780735402775 (ISBN)
    Book
    Mixed media product
    €327.42
    No shipping information available
  9. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology: 2003
    2003 International Conference on Characterization and Metrology for ULSI Technology
    11/2003
    1st EDN1st Edition
    American Institute of Physics
    9780735401525 (ISBN)
    Book
    Hardback
    €176.50
    No shipping information available
  10. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology 2000
    International Conference
    04/2001
    1st EDN1st Edition
    American Institute of Physics
    9781563969676 (ISBN)
    Book
    Mixed media product
    €245.03
    No shipping information available
  11. This image is currently not available.
    W. Murray Bullis | Alain C. Diebold | David G. Seiler
    Semiconductor Characterization
    Present Status and Future Need
    11/1995
    American Institute of Physics
    9781563965036 (ISBN)
    Book
    Hardback
    €71.19
    Exhausted; no reprint
  12. This image is currently not available.
    Laurel Seiler Brunvoll | David G. Seiler
    Life on Hold
    Finding Hope in the Face of Serious Illness
    03/2001
    Multnomah Press
    9781576737606 (ISBN)
    Book
    Paperback/Softback
    €28.65
    Exhausted, reprint undefined