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Your search for Alain C. Diebold

  1. Cover: Handbook of Silicon Semiconductor Metrology - CRC Press
    Alain C. Diebold
    Handbook of Silicon Semiconductor Metrology
    06/2001
    1st EDN1st Edition
    CRC Press
    9781135554835 (ISBN)
    E-Book
    ePUB
    Other editions
    €92.49
    Available for download
  2. Cover: Handbook of Silicon Semiconductor Metrology - CRC Press
    Alain C. Diebold
    Handbook of Silicon Semiconductor Metrology
    06/2001
    CRC Press
    9780203904541 (ISBN)
    E-Book
    PDF
    Other editions
    €92.49
    Available for download
  3. Cover: Handbook of Silicon Semiconductor Metrology - CRC Press
    Alain C. Diebold
    Handbook of Silicon Semiconductor Metrology
    10/2019
    1st EDN1st Edition
    CRC Press
    9780367397166 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €81.82
    Shipment within 15-20 days
  4. Cover: Handbook of Silicon Semiconductor Metrology - CRC Press
    Alain C. Diebold
    Handbook of Silicon Semiconductor Metrology
    06/2001
    1st EDN1st Edition
    CRC Press
    9780824705060 (ISBN)
    Book
    Hardback
    Other editions
    €487.50
    Shipment within 15-20 days
  5. Cover: Frontiers of Characterization and Metrology for Nanoelectronics - American Institute of Physics
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics
    2009
    11/2009
    1st EDN1st Edition
    American Institute of Physics
    9780735407121 (ISBN)
    Book
    Hardback
    €199.72
    No shipping information available
  6. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics: 2011
    04/2012
    1st EDN1st Edition
    American Institute of Physics
    9780735409736 (ISBN)
    Book
    Mixed media product
    €171.15
    The article will not be published
  7. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics
    2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
    10/2007
    1st EDN1st Edition
    American Institute of Physics
    9780735404410 (ISBN)
    Book
    Mixed media product
    €147.50
    No shipping information available
  8. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Characterization and Metrology for ULSI Technology 2005
    11/2005
    1st EDN1st Edition
    American Institute of Physics
    9780735402775 (ISBN)
    Book
    Mixed media product
    €327.42
    No shipping information available
  9. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology: 2003
    2003 International Conference on Characterization and Metrology for ULSI Technology
    11/2003
    1st EDN1st Edition
    American Institute of Physics
    9780735401525 (ISBN)
    Book
    Hardback
    €176.50
    No shipping information available
  10. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology 2000
    International Conference
    04/2001
    1st EDN1st Edition
    American Institute of Physics
    9781563969676 (ISBN)
    Book
    Mixed media product
    €245.03
    No shipping information available
  11. This image is currently not available.
    W. Murray Bullis | Alain C. Diebold | David G. Seiler
    Semiconductor Characterization
    Present Status and Future Need
    11/1995
    American Institute of Physics
    9781563965036 (ISBN)
    Book
    Hardback
    €71.19
    Exhausted; no reprint