Advanced Transmission Electron Microscopy
Imaging and Diffraction in Nanoscience
Published on 26. October 2016
XXVI, 729 pages
978-1-4939-6607-3 (ISBN)
Description
This volume expands and updates the coverage in the authors' popular 1992 book,
Electron Microdiffraction
. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas.
Advanced Transmission Electron Microscopy: Imaging and Diffraction
in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.
Reviews / Votes
"This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy . . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work." (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)More details
Series
Edition
1st ed. 2017
Language
English
Place of publication
New York
United States
Publishing group
Springer US
Target group
Primary & secondary/elementary & high school
Product notice
Reflowable
Illustrations
XXVI, 729 p. 310 illus., 218 illus. in color.
File size
27,48 MB
ISBN-13
978-1-4939-6607-3 (9781493966073)
DOI
10.1007/978-1-4939-6607-3
Schweitzer Classification
Other editions
Additional editions
Jian Min Zuo | John C.H. Spence
Advanced Transmission Electron Microscopy
Imaging and Diffraction in Nanoscience
Book
10/2016
Springer
€139.09
Shipment within 15-20 days
Persons
Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society.
John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
Content
Introduction and historical background.- Electron Waves and Wave Propagation.- The geometry of electron diffraction patterns.- Kinematical Theory of Electron Diffraction.- Dynamical Theory of Electron Diffraction for Perfect Crystals.- Electron optics.- Lens aberrations and Aberration Correction.- Electron Sources.- Electron Detectors.- Instrumentation and experimental techniques.- Crystal symmetry.- Crystal structure and bonding.- Diffuse Scattering.- Atomic resolution electron imaging.- Imaging and characterization of crystal defects.- Strain Measurements and Mapping.- Structure of Nanocrystals, Nanoparticles and Nanotubes.
