Electron Microscopy In Material Science

ContentsContributors Foreword Introduction Opening LectureP. B. Hirsch : The Impact of Transmission Electron Microscopy in the Science of Materials 1. Historical Introduction 3 2. Application of TEM in Materials Science 2.1. Dislocation Theory 2.2. Mechanical Properties 2.3. Point Defects and Dislocations: Quench-Hardening 2.4. Radiation Damage 2.5. Phase Transformations 2.6. Kinetic Studies 2.7. Surface Layer Studies 2.8. Magnetic Properties 2.9. Miscellaneous Applications 3. Conclusions 4. Future Prospects References Electron Optics and InstrumentationA. Septier: Geometrical Electron Optics 1. Electrostatic Lenses 1.1. Introduction 1.2. Equation of Motion in an Electrostatic Lens 1.3. The Properties of Some Electrostatic Lenses 1.4. Aberrations of Electrostatic Lenses 2. Magnetic Lenses 2.1. Principle 2.2. The Motion of Particles in a Magnetic Lens 2.3. Optical Properties 2.4. Aberrations of Magnetic Lenses 2.5. Magnetic Lenses for High Voltage Microscopes 3. Quadrupole Lenses 3.1. Introduction 3.2. Optical Properties of Quadrupole Lenses 3.3. Quadrupole Systems Suitable as Objectives 3.4. The Aperture Aberrations of Quadrupole Systems and their Correction 3.5. Correction of Chromatic Aberration 4. Prisms Optics 4.1. Introduction 4.2. Simple Prisms 4.3 Magnetic Prisms 4.4. Electrostatic Prisms References A. Septier: Problems on Geometrical Electron Optics 1. Electrostatic Lenses l.l. Problems 1.2. Solutions 2. Round Magnetic Lenses 2.1. Problems 2.2. Solutions 3. Quadrupole Lenses 3.1. Problems 3.2. Solutions 4. Prisms 4.1. Problems 4.2. Solutions R. Castaing: Secondary Ion Microanalysis and Energy-Selecting Electron Microscopy 1. Dispersive Microscopy Using Magnetic Prisms 1.1. Introduction 1.2. First-Order Focussing Properties of a Simple Magnetic Prism 1.3. The Dispersive System of the Energy-Selecting Electron Microscope 1.4. The Dispersive System of the Secondary Ion Microanalyzer References (Section 1) 2. Some Applications of the Magnetic Filtering of Energies in Electron Microscopy 2.1. Introduction 2.2. The Various Scattering Processes that an Electron May Undergo in a Solid Sample 2.3. Energy Selection and « Colour » Electron Microscopy 2.4. Experimental Investigation of the Coherency of the Interaction of Fast Electrons with a Solid Sample References (Section 2) 3. Ion emission Microanalysis 3.1. Introduction 3.2. General Description of the Secondary Ion Microanalyzer 3.3. Possibilities and Limitations of Secondary Ion Microanalysis 3.4. The Various Processes Involved in Secondary Ion Emission 3.5. The Alternative Procedure Using an Ion Microprobe 3.6. The Main Features of the « Kinetic » Process 3.7. Some Applications of Secondary Ion Microanalysis References (Section 3) ¿. V. Crewe : High Intensity Electron Sources and Scanning Electron Microscopy 1. Field emission and an electron Gun 1.1. Introduction 1.2. Field Emission as an Electron Source 1.3. The Electron Gun 1.4. Optical Properties of the Electron Gun References (Section 1) 2. Microscope Design Using Field Emission Gun 2.1. Simple Scanning Microscope 2.2. High Resolution Microscope References (Section 2) 3. Contrast Mechanisms in a High Resolution Scanning Microscope 3.1. Mechanisms Identical to the Conventional Microscope 3.2.