Electron Probe Microanalysis

ContentsList of ContributorsForewordSurvey of Microanalysis-Interpolation and Extrapolation Text ReferencesBehavior of Electrons in a Specimen I. Introduction II. Backscattering and Diffusion of Electrons III. Spot Size of Diffused X-Ray Source and Depth Distribution of Characteristic X-Ray IV. Resolving Power of Electron Microprobe V. Application of Backscattered Electron and Specimen Current Methods ReferencesThe Sandwich Sample Technique Applied to Quantitative Microprobe Analysis I. Introduction II. The Absorption Correction III. Fluorescence Due to Characteristic Lines IV. The Atomic Number Effect V. A Model for Quantitative Electron Probe Microanalysis ReferencesQuantitative Microprobe Analysis: A Basis for Universal Atomic Number Correction Tables and Victor G. Macres I. Introduction II. Formulation of Atomic Number Correction III. Discussion and Evaluation of the Correction Formula IV. Basis for Universal Correction Tables V. Application to Experimental Data VI. Summary and Conclusions Appendix I. Tabulation of ¿' Values Appendix II. Example Calculation Using Universal Atomic Number Correction Tables Appendix III. Mass Absorption Coefficients Appendix IV. Mass Absorption Coefficients ReferencesDeconvolution: A Technique to Increase Electron Probe Resolution Summary I. Introduction II. Theory of the Deconvolution Method III. Mathematics of the Deconvolution Method IV. Experimental Measurements V. Reduction of Data VI. Discussion ReferencesAnalysis for Low Atomic Number Elements with the Electron Microprobe I. Introduction II. The Stearate Crystal III. Reduction of Carbon Contamination IV. Analysis of the Light Elements ReferencesChanges in X-Ray Emission Spectra Observed between the Pure Elements and Elements in Combination with Others to Form Compounds or Alloys I. Introduction II. X-Ray Emission Spectra III. Applications ReferencesBackscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis I. Introduction II. Qualitative Considerations III. Experimental Techniques IV. Quantitative Analysis V. Scanning Images ReferencesThe Influence of the Preparation of Metal Specimens on the Precision of Electron Probe Microanalysis I. Introduction II. Problems in Specimen Preparation III. Effects of Surface Roughness IV. Effects of Leaching, Deposition, Smearing, and Etching V. Effects of Anodic or Vapor Deposited Films VI. Conclusions ReferencesElectron Probe Microanalysis in Mineralogy I. Introduction II. Sample Preparation III. Problems Inherent in Mineral Analysis IV. Qualitative Analysis of Minerals V. Quantitative Analysis of Minerals VI. Examples of Electron Probe Analysis in Mineralogy VII. Future Trends VIII. Conclusions ReferencesElectron Probe Analysis in Metallurgy I. Introduction II. Applications in Metallography III. Kinetic Processes IV. Conclusion ReferencesScanning Electron Probe Measurement of Magnetic Fields I. Introduction II. Basic Description of the Method III. Magnetic Field Calculation IV. Angular Deflection of Secondaries V. Detected Signal Due to Magnetic Field VI. Detected Signal Due to Surface Relief VII. Other Limitations VIII. Description of Detector IX. Specimen Preparation X. Measurement Techniques, Results and Discussion XI. Image Displays XII. Conclusions Appendix I. Other Detector Applications Appendix II. Specimen and Collector Currents under Bias Conditions Appendix III. Magnetic Signal under Bias Conditions ReferencesNondispersive X-Ray Emission Analysis for Lunar Surface Geochemical Exploration I. Introduction II. Data Analysis III.