Quantum Metrology, Imaging, and Communication
Published on 2. November 2016
XII, 273 pages
978-3-319-46551-7 (ISBN)
Description
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
More details
Series
Edition
1st ed. 2017
Language
English
Place of publication
Cham
Switzerland
Publishing group
Springer International Publishing
Target group
Primary & secondary/elementary & high school
Product notice
Reflowable
Illustrations
XII, 273 p. 105 illus., 68 illus. in color.
File size
6,97 MB
ISBN-13
978-3-319-46551-7 (9783319465517)
DOI
10.1007/978-3-319-46551-7
Schweitzer Classification
Other editions
Additional editions
David S. Simon | Gregg Jaeger | Alexander V. Sergienko
Quantum Metrology, Imaging, and Communication
Book
12/2016
Springer
€160.49
Shipment within 10-15 days
Persons
David Simon. Professor, Stonehill College, Easton MA 02357, USA
Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA
Alexander V. Sergienko, Boston University, Boston MA 02215, USA
Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA
Alexander V. Sergienko, Boston University, Boston MA 02215, USA
Content
Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.
