VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Published on 17. August 2019
XVI, 775 pages
978-981-329-767-8 (ISBN)
Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Publishing group
Springer Singapore
Target group
Professional and scholarly
Product notice
Reflowable
Illustrations
XVI, 775 p. 545 illus., 336 illus. in color.
File size
113,13 MB
ISBN-13
978-981-329-767-8 (9789813297678)
DOI
10.1007/978-981-32-9767-8
Schweitzer Classification
Other editions
Additional editions
Anirban Sengupta | Sudeb Dasgupta | Virendra Singh
VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Book
08/2019
Springer
€115.55
Shipment within 3-4 weeks
Content
Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.
