Circuit Design for Reliability
1st Edition
Published on 8. November 2014
VI, 272 pages
978-1-4614-4078-9 (ISBN)
Description
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
More details
Series
Language
English
Place of publication
New York
United States
Publishing group
Springer US
Target group
Professional and scholarly
Product notice
Reflowable
Illustrations
VI, 272 p. 190 illus., 132 illus. in color.
File size
12,28 MB
ISBN-13
978-1-4614-4078-9 (9781461440789)
DOI
10.1007/978-1-4614-4078-9
Schweitzer Classification
Other editions
Additional editions
Ricardo Reis | Yu Cao | Gilson Wirth
Circuit Design for Reliability
Book
11/2014
Springer
€106.99
Shipment within 15-20 days
Persons
Content
Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
