VLSI Design and Test
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Published on 24. January 2019
XVIII, 722 pages
978-981-13-5950-7 (ISBN)
Description
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Publishing group
Springer Singapore
Target group
Professional and scholarly
Product notice
Reflowable
Illustrations
XVIII, 722 p. 711 illus., 324 illus. in color.
File size
89,31 MB
ISBN-13
978-981-13-5950-7 (9789811359507)
DOI
10.1007/978-981-13-5950-7
Schweitzer Classification
Other editions
Additional editions
S. Rajaram | N.B. Balamurugan | D. Gracia Nirmala Rani
VLSI Design and Test
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Book
01/2019
Springer
€106.99
Shipment within 15-20 days
Content
Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.
