Characterization, Testing, Measurement, and Metrology
1st Edition
Published on 25. October 2020
204 pages
978-1-000-19335-0 (ISBN)
Description
This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.
The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.
The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.
The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.
The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.
More details
Series
Edition
1. Auflage
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
Product notice
Reflowable
Illustrations
29 Tables, black and white; 56 Line drawings, black and white; 62 Halftones, black and white; 118 Illustrations, black and white
ISBN-13
978-1-000-19335-0 (9781000193350)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Chander Prakash | Sunpreet Singh | J. Paulo Davim
Characterization, Testing, Measurement, and Metrology
Book
10/2024
1st Edition
CRC Press
€95.40
Shipment within 15-20 days
Chander Prakash | Sunpreet Singh | J. Paulo Davim
Characterization, Testing, Measurement, and Metrology
Book
10/2020
1st Edition
CRC Press
€261.80
Shipment within 15-20 days
Book
10/2020
CRC Press
Unfortunately, price unknown
Available (delivery time upon request)
Persons
Chander Prakash, Sunpreet Singh, J. Paulo Davim
Content
1. Mechanical Property Characterization of Construction Materials. 2. Evaluation of Material Surface Integrity. 3. Characterizations: SEM/FESEM, EDS, XRD, XPS, AFM, TEM, STEM, FTIR, DSC, TGA, DMA. 4. Mechanical Behaviour: Fracture, Damage, Fatigue. 5. Tribology and Wear. 6. Interfaces and Interphases. 7. Creep and Aggressive Environment. 8. Corrosion. 9. Measurement, Performance Analysis, and Characterization of Materials, Devices, and Systems
using Advanced Technologies. 10. Characterization of Surfaces and the Relationship between Surface Properties and their
Applications. 11. Surface Metrology - Measurement and Characterization of Surface Topography including
Functional Properties of Surfaces. 12. Measurement & Metrology in Materials and Advanced Manufacturing: Roughness, Forces, Corrosion, Wear, Crack Propagation and Fatigue. 13. Monitoring and Control of Machining/Manufacturing Processing of Advanced Materials. 14. Optimization of Machining/Manufacturing Processing. 15. Computational Intelligence: Neural, fuzzy, Genetic, and Swarm Particle Optimization. 16. Vision-Based Control and Control Engineering.
using Advanced Technologies. 10. Characterization of Surfaces and the Relationship between Surface Properties and their
Applications. 11. Surface Metrology - Measurement and Characterization of Surface Topography including
Functional Properties of Surfaces. 12. Measurement & Metrology in Materials and Advanced Manufacturing: Roughness, Forces, Corrosion, Wear, Crack Propagation and Fatigue. 13. Monitoring and Control of Machining/Manufacturing Processing of Advanced Materials. 14. Optimization of Machining/Manufacturing Processing. 15. Computational Intelligence: Neural, fuzzy, Genetic, and Swarm Particle Optimization. 16. Vision-Based Control and Control Engineering.
