Applied Statistical Designs for the Researcher
Published on 20. August 2003
712 pages
978-1-4822-7624-4 (ISBN)
Description
Showcasing a discussion of the experimental process and a review of basic statistics, this volume provides methodologies to identify general data distribution, skewness, and outliers. It features a unique classification of the nonparametric analogs of their parametric counterparts according to the strength of the collected data. Applied Statistical Designs for the Researcher discusses three varieties of the Student t test, including a comparison of two different groups with different variances; two groups with the same variance; and a matched, paired group. It introduces the analysis of variance and Latin Square designs and presents screening approaches to comparing two factors and their interactions.
More details
Series
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
College/higher education
File size
35,21 MB
ISBN-13
978-1-4822-7624-4 (9781482276244)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Daryl S. Paulson
Applied Statistical Designs for the Researcher
Book
09/2019
1st Edition
CRC Press
€98.90
Shipment within 15-20 days
Daryl S. Paulson
Applied Statistical Designs for the Researcher
Book
08/2003
1st Edition
CRC Press
€189.40
Shipment within 15-20 days
Content
Research and Statistics Basic Review of Parametric Statistics Exploratory Data Analysis Two Sample Tests Completely Randomized One-Factor Analysis of Variance One and Two Restrictions on Randomization Completely Randomized Two-Factor Factorial Designs Two-Factor Factorial Completely Randomized Blocked Designs Useful Small Scale Pilot Designs Nested Statistical Designs Linear Regression Nonparametric Statistics Introduction to Research Synthesis and Meta-Analysis and Conclusory Remarks References Index.
