Cover: The Physics of SiO2 and Its Interfaces - Elsevier

The Physics of SiO2 and Its Interfaces

Proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24, 1978
Elsevier (Publisher)
Published on 17. September 2013
500 pages
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978-1-4831-3900-5 (ISBN)
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