Fourier Transform Spectrometry
Published on 14. May 2014
277 pages
978-0-08-050691-3 (ISBN)
Description
Fourier Transform Spectrometry is of immediate use to those who use Fourier transform spectrometers in their research, or are considering their use. The authors' presentations enable readers to obtain a clear understanding of FTS, which is crucial to their studies and research.Due to the increasing complexity and commercialization of instrumentation, achieving optimum performance in research applications and automated usage can be challenging. For example, a thorough understanding of the instrument can dramatically affect the outcome of the experiment and the generation of reliable data in applications where conditions are not ideal and resulting signals are weak. This book provides a comprehensive discussion of FTS from the ground up, covering basic concepts, instrumentation, data-processing algorithms, and techniques for computerized spectral analysis.
More details
Language
English
Place of publication
San Diego
United States
Product notice
Windows
ISBN-13
978-0-08-050691-3 (9780080506913)
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Schweitzer Classification
Other editions
Additional editions
Sumner P. Davis | Mark C. Abrams | James W. Brault
Fourier Transform Spectrometry
Book
05/2001
Academic Press
€139.50
Shipment within 15-20 days
Persons
Sumner P. Davis is a professor of physics at the University of California at Berkeley. His research focuses on laboratory spectroscopy of diatomic molecules of astrophysical interest.James W. Brault is a physicist and was a staff scientist of the National Solar Observatory, Kitt Peak, with an appointment at the University of Colorado in Boulder. His areas of research are instrument design, numerical methods as applied to spectroscopy, and atomic and molecular spectroscopy.
Content
IntroductionWhy Choose a Fourier Transform Spectrometer?Theory of the Ideal InstrumentFourier AnalysisNonideal (Real-World) InterferogramsWorking with Digital Spectra and Fourier TransformsPhase Corrections and Their SignificanceEffects of Noise in Its Various FormsLine Positions, Line Profiles, and FittingProcessing of Spectral DataDiscussions, Interventions, Digressions, and ObscurationsChapter-by-Chapter BibliographyChronological BibliographyApplications BibliographyAuthor BibliographyIndex
