Advances in Optical and Electron Microscopy
Published on 22. October 2013
376 pages
978-1-4832-8800-0 (ISBN)
Description
The volumes in this series cover the progress and innovation in optical and electron microscopy at a fundamental level. It is aimed at microscopists and researchers not only interested in microscope instrumentation but also in applications ranging from biological techniques to materials research and industrial inspection.
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Other editions
Additional editions
T. Mulvey | Colin Sheppard
Advances in Optical and Electron Microscopy: v. 12
Book
11/1997
Academic Press
€89.91
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Content
G. Mollenstedt, The Invention of the Electron Fresnal Interference Biprism. H. Lichte, Electron Image Plane Off-Axis Holography of Atom Structures. P. Kruit, Magnetic Through-the-Lens Detection in Electron Microscopy and Spectroscopy, Part I. L. Dubbeldam, Advances in Voltage Contrast Detectors in Scanning Electron Microscopes. D.W. Pohl, Scanning Near-Field Optical Microscopy (SNOM). J. Hartikuinen, J. Jaarinen, and M. Luukkala, Microscopic Thermal Wave Non-destructive Testing.
