Advances in Optical and Electron Microscopy

ContributorsPrefaceInstrumentation and Operation for High-Resolution Electron Microscopy I. Introduction II. Instrumentation A. The Electron Source B. Electron Lenses C. Specimen Stages D. Viewing and Recording Systems E. Complete Systems III. Image Formation A. Transfer Theory and Envelope Functions B. Definitions of Resolution C. Weak Phase Objects D. Multi-Slice Simulations and Thicker Materials IV. Imaging Modes A. Axial-Illumination Bright-Field B. Tilted-Illumination Bright-Field C. Tilted-Illumination Dark-Field D. Hollow-Cone V. Important Parameters A. Image Magnification B. Diffraction Pattern and Camera Length C. Crystal Alignment D. Incident Beam Alignment E. Objective Lens Focus F. Spherical Aberration G. Objective Lens Astigmatism H. Spread of Focus I. Illumination Angle VI. Concurrent Developments A. Scanning Transmission Electron Microscopy B. Convergent Beam and Micro-Diffraction C. Microanalysis D. Ultrahigh Vacuum E. On-Line Image Processing F. Radiation Damage VII. Conclusion ReferencesElectron Microscopy of Surface Structure I. History of Surface Imaging by Conventional Transmission Electron Microscopy II. Ultrahigh-Vacuum Electron Microscope Techniques for Surface Studies A. Ultrahigh-Vacuum Conditions B. In Situ Specimen Treatment Facilities C. Specimen Holders D. Analytical Equipment E. Image Recording Systems III. Characteristics of Observations and Results A. Transmission Electron Microscopy (TEM) and Transmission Electron Diffraction (TED) B. Reflection Electron Microscopy (REM) and Reflection High-Energy Electron Diffraction (RHEED) IV. Summary and Concluding Remarks References Notes Added in ProofIon Probe Microscopy I. Introduction A. Physical Background B. General Experimental Arrangement II. Ion Sources A. Plasma Sources B. Surface Ionization Sources C. Field Ion Sources III. Mass Separation of Primary Ions IV. Secondary Ion Mass Spectrometry with High Lateral Resolution A. Ion Emission Microscopy B. Ion Microprobes V. Secondary Ion Collection A. Correlation between Sample Consumption and Sensitivity B. Transmission in Ion Microscopy C. Transmission in Ion Microprobes VI. Applications VII. Conclusion ReferencesAcoustic Microscopy I. Introduction II. Principle of Operation III. Imaging Modes IV. Quantitative Methods V. Biological Applications and Near-Surface Imaging of Solids VI. Interior Imaging VII. Towards Higher Resolution VIII. Conclusion Acknowledgments References AppendixIndex