Morphological Image Operators
Academic Press
Published on 1. September 2020
520 pages
978-0-12-821004-8 (ISBN)
Description
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
More details
Other editions
Additional editions
Book
09/2020
Academic Press
€222.84
Shipment within 15-20 days
Persons
Content
1. First principles
Henk J.A.M. Heijmans
2. Complete lattices
Henk J.A.M. Heijmans
3. Operators on complete lattices
Henk J.A.M. Heijmans
4. Operators which are translation invariant
Henk J.A.M. Heijmans
5. Adjunctions, dilations, and erosions
Henk J.A.M. Heijmans
6. Openings and closings
Henk J.A.M. Heijmans
7. Hit-or-miss topology and semi-continuity
Henk J.A.M. Heijmans
8. Discretization
Henk J.A.M. Heijmans
9. Convexity, distance, and connectivity
Henk J.A.M. Heijmans
10. Lattice representations of functions
Henk J.A.M. Heijmans
11. Morphology for grey-scale images
Henk J.A.M. Heijmans
12. Morphological filters
Henk J.A.M. Heijmans
13. Filtering and iteration
Henk J.A.M. Heijmans
