Design, Analysis and Test of Logic Circuits Under Uncertainty
1st Edition
Published on 21. September 2012
XII, 124 pages
978-90-481-9644-9 (ISBN)
Description
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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Other editions
Additional editions
Smita Krishnaswamy | Igor L. Markov | John P. Hayes
Design, Analysis and Test of Logic Circuits Under Uncertainty
Book
10/2014
Springer
€106.99
Shipment within 15-20 days
Smita Krishnaswamy | Igor L. Markov | John P. Hayes
Design, Analysis and Test of Logic Circuits Under Uncertainty
Book
09/2012
Springer
€106.99
Shipment within 15-20 days
Content
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.
