Monte Carlo Modeling for Electron Microscopy and Microanalysis
Published in December 1995
225 pages
978-0-19-535846-9 (ISBN)
Description
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.
More details
Edition
Annotated edition
Language
English
Place of publication
Oxford
United Kingdom
Edition type
Annotated edition
Illustrations
73 illus.
File size
10,76 MB
ISBN-13
978-0-19-535846-9 (9780195358469)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Book
06/1995
Oxford University Press Inc
€407.20
Shipment within 15-20 days
Content
- Intro
- Contents
- 1. An Introduction to Monte Carlo Methods
- 1.1. Electron Beam Interaction-The Problem
- 1.2. The Monte Carlo Method
- 1.3. Brief History of Monte Carlo Modeling
- 1.4. About This Book
- 2. Constructing a Simulation
- 2.1. Introduction
- 2.2. Describing the Problem
- 2.3. Programming the Simulation
- 2.4. Reading a PASCAL Program
- 2.5. Running the Simulation
- 3. The Single Scattering Model
- 3.1. Introduction
- 3.2. Assumptions of the Single Scattering Model
- 3.3. The Single Scattering Model
- 3.4. The Single Scattering Monte Carlo Code
- 3.5. Notes on the Procedures and Functions Used in the Program
- 3.6. Running the Program
- 4. The Plural Scattering Model
- 4.1. Introduction
- 4.2. Assumptions of the Plural Scattering Model
- 4.3. The Plural Scattering Monte Carlo Code
- 4.4. Notes on the Procedures and Functions Used in the Program
- 4.5. Running the Program
- 5. The Practical Application of Monte Carlo Models
- 5.1. General Considerations
- 5.2. Which Type of Monte Carlo Model Should Be Used?
- 5.3. Customizing the Generic Programs
- 5.4. The "All Purpose" Program
- 5.5. The Applicability of Monte Carlo Techniques
- 6. Backscattered Electrons
- 6.1. Backscattered Electrons
- 6.2. Testing the Monte Carlo Models of Backscattering
- 6.3. Predictions of the Monte Carlo Models
- 6.4. Modeling Inhomogeneous Materials
- 6.5. Notes on the Program
- 6.6. Incorporating Detector Geometry and Efficiency
- 7. Charge Collection Microscopy and Cathodoluminescence
- 7.1. Introduction
- 7.2. The Principles of EBIC and C/L Image Formation
- 7.3. Monte Carlo Modeling of Charge Collection Microscopy
- 8. Secondary Electrons and Imaging
- 8.1. Introduction
- 8.2. First Principles-SE Models
- 8.3. The Fast Secondary Model
- 8.4. The Parametric Model
- 9. X-ray Production and Microanalysis
- 9.1. Introduction
- 9.2. The Generation of Characteristic X-rays
- 9.3. The Generation of Continuum X-rays
- 9.4. X-ray Production in Thin Films
- 9.5. X-ray Production in Bulk Samples
- 10. What Next in Monte Carlo Simulations?
- 10.1. Improving the Monte Carlo Model
- 10.2. Faster Monte Carlo Modeling
- 10.3. Alternatives to Sequential Monte Carlo Modeling
- 10.4. Conclusions
- References
- Index
- A
- B
- C
- D
- E
- F
- G
- H
- I
- J
- K
- M
- N
- O
- P
- Q
- R
- S
- T
- U
- V
- W
- X
