Quantitative X-Ray Spectrometry
2nd Edition
Published on 26. April 1995
504 pages
978-1-4822-7338-0 (ISBN)
Description
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals
Reviews / Votes
"International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. "---Analytical Chemistry
". . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. "
---Journal of Applied Crystallography
"Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. "
---Journal of Analytical Atomic Spectrometry
More details
Series
Edition
2nd edition
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
ISBN-13
978-1-4822-7338-0 (9781482273380)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Ron Jenkins
Quantitative X-Ray Spectrometry
Book
04/1995
2nd Edition
CRC Press
€408.30
Shipment within 15-20 days
Content
The interaction of X-rays with matter; sources for the excitation of characteristic X-rays; instrumentation; statistics; general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis; specimen preparation; qualitative analysis; basic problems in quantitative analysis; methods and models for quantitative analysis; trace analysis; radiation health hazards in X-ray spectrometry; applications of X-ray spectrometry. Appendices: no-menclature; mass absorption coefficients; conversions and physical constants; atomic weights and densities; wavelengths and energies; wavelength tables for K, L, and M series.
