Characterisation of Radiation Damage by Transmission Electron Microscopy
Published on 21. November 2000
224 pages
978-1-040-20586-0 (ISBN)
Description
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
More details
Series
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
College/higher education
Professional and scholarly
File size
20,66 MB
ISBN-13
978-1-040-20586-0 (9781040205860)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
M.L Jenkins | M.A Kirk
Characterisation of Radiation Damage by Transmission Electron Microscopy
Book
11/2000
1st Edition
Institute of Physics Publishing
€357.13
Shipment within 10-20 days
Content
The role of transmission electron microscopy in characterising radiation damage. An introduction to the available contrast mechanisms and experimental techniques. Analysis of small centres of strain: the determination of loop morphologies. Analysis of small centres of strain: determination of the vacancy or interstitial natural of small clusters. Analysis of small centres of strain: counting and sizing small clusters. Characterisation of voids and bubbles. Techniques for imaging displacement cascades. High-resolution imaging of radiation damage. In-situ irradiation experiments. Applications of analytical techniques. Radiation damage in amorphous glass. Appendix: The Thompson tetrahdron. References. Index.
