Advances in Imaging and Electron Physics
Published on 23. August 2022
266 pages
978-0-323-98864-3 (ISBN)
Description
Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods
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Martin Hytch | Peter W. Hawkes
Advances in Imaging and Electron Physics: Volume 223
Book
08/2022
Academic Press
€219.50
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Content
PrefaceMartin Hÿtch and Peter W. Hawkes1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methodsClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy2. Development of a global homography-based approach for high-angular resolution in the SEMClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy3. Implementing the homography-based global approachClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy4. Numerical validation and influence of optical distorsions on accuracyClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy5. Applications of the methodClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devicesClifford M. Krowne
