
A Guide to Noise in Microwave Circuits
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A fulsome exploration of critical considerations in microwave circuit noise
In A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement, a team of distinguished researchers deliver a comprehensive introduction to noise in microwave circuits, with a strong focus on noise characterization of devices and circuits. The book describes fluctuations beginning with their physical origin and touches on the general description of noise in linear and non-linear circuits.
Several chapters are devoted to the description of noise measurement -techniques and the interpretation of measured data. A full chapter is dedicated to noise sources as well, including thermal, shot, plasma, and current.
A Guide to Noise in Microwave Circuits offers examples of measurement problems--like low noise block (LNB) of satellite television - and explores equipment and measurement methods, like the Y, cold source, and 7-state method. This book also includes:
* A thorough introduction to foundational terms in microwave circuit noise, including average values, amplitude distribution, autocorrelation, cross-correlation, and noise spectra
* Comprehensive explorations of common noise sources, including thermal noise, the Nyquist formula and thermal radiation, shot noise, plasma noise, and more
* Practical discussions of noise and linear networks, including narrowband noise
* In-depth examinations of calculation methods for noise quantities, including noise voltages, currents, and spectra, the noise correlation matrix, and the noise of simple passive networks
Perfect for graduate students specializing in microwave and wireless electronics, A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement will also earn a place in the libraries of professional engineers working in microwave or wireless circuits and system design.
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Persons
Dr. Peter Heymann, retired, was the Head of the Microwave Measurement Laboratory at the Ferdinand-Braun-Institut (FBH), Leibniz-Institute for High Frequency Technology in Berlin, Germany.
Dr. Matthias Rudolph, is Ulrich L. Rohde Professor for RF and Microwave Techniques at Brandenburg University of Technology in Cottbus, Germany. He heads the Low-Noise components laboratory at the FBH.
Content
Author Biographies xiii
Preface xv
1 Introduction 1
Preliminary Remarks 1
History 6
References 7
2 Basic Terms 9
Average Values 9
Amplitude Distribution 10
Autocorrelation 12
Cross-Correlation 15
Noise Spectra 18
Autocorrelation Function and Spectral Power Density 19
Band-Limited Noise on the Spectrum Analyzer 20
References 22
3 Noise Sources 23
Thermal Noise 23
Nyquist Formula and Thermal Radiation 24
Validity and Experimental Confirmation of the Nyquist Formula 27
Thermal Noise Under Extreme Conditions 28
Shot Noise 29
Plasma Noise 33
Current Noise of Resistors and Contacts 34
Technical Resistors 34
Resistors Consisting of Semiconductor Material 36
Contact Noise 37
Generation-Recombination Noise 38
LF Noise from Transistors 40
References 42
4 Noise and Linear Networks 45
Narrowband Noise 45
Calculating with Phasors 45
Noise Source with Complex Internal Resistance 51
The Equivalent Noise Bandwidth 52
Network Components at Different Temperatures 54
Noise Generator and Attenuator 58
References 58
5 Nonlinear Networks 59
Mixing 59
Band-Limited RF Noise at Input 59
Amplitude Clipping 62
The Detector as a Nonlinear Network 63
The Noise Spectrum Behind a Quadratic Detector 65
The Noise Spectrum Behind a Linear Detector 69
The Sensitivity Limit 70
Noise with Signal 73
The Phase Sensitive Rectifier 74
Trace Averaging 76
References 78
6 The Noise Factor 79
Amplifier and Noise Power 79
The Noise Factor F 80
Cascaded Amplifiers 83
The Noise measure m 85
Definitions of Gain 85
Source and Load 89
Broadband and Spot Noise Factor 91
Noise Factor of a Passive Network 92
Antenna Temperature 93
The Reference Temperature T 0 = 290 K 98
Noise Factor and Detection Limit 99
References 100
7 Noise of Linear Two-Ports 101
Representation of Two-Ports 101
Noise Modeling Using the Chain Matrix 102
References 108
8 Calculation Methods for Noise Quantities 109
Noise Voltages, Currents, and Spectra 109
Calculating with Current, Voltage, and Noise Waves 112
The Noise Correlation Matrix 115
The Correlation Matrix of Passive Components 117
The Noise of Simple Passive Networks 119
Transformation of Noise Sources in Different Network Representations 128
Correlation Matrix and IEEE Elements 131
FET-Like Network with the Y-Correlation Matrix 134
Noise Sources at Input with ABCD Correlation Matrix 138
References 142
9 Diodes and Bipolar Transistors 143
Semiconductor Diode 143
Bipolar Transistor 145
Small-Signal Equivalent Circuit 147
Hawkins BJT Noise Model 148
Two Approaches for the Collector Noise Current Source 155
BJT Noise Model with Correlation Matrices 157
The ¿-Model 157
The T-Model with Correlation Matrices 161
Transformation of the Y-Sources to the Input 165
Modeling of a Microwave Transistor with Correlation Matrices 168
Simplest ¿-Model 174
Contour Diagram 177
Transistor in the Circuit 179
Using the Contour Diagram 183
References 185
10 Operational Amplifier 187
Operational Amplifier as Circuit Element 187
Noise Sources of the Operational Amplifier 188
Consideration of 1/f Noise 193
Operational Amplifier as an Active Low-Pass Filter 195
References 198
11 Field Effect Transistors 201
Jfet 201
Mode of Operation of the FET 201
The Channel Noise 204
NoiseSourcesattheGate 205
The Correlation 206
Transformation to the Input 206
Simple Approximations 211
Field Effect Transistors for the Microwave Range (MESFET, HFET) 214
The Pucel Model 215
The Pospieszalski model 218
Discussion of the Results 225
Criteria for Noise Data 225
References 229
12 Theory of Noise Measurement 231
Measurements of Two-Ports 231
The Equivalent Noise Resistance 234
Voltage and Current Source 235
Voltage and Current Source with Correlation 237
3 dB and Y-Method 241
References 243
13 Basics of Measuring Technique 245
Principles of the RF-Receiver 245
The Detection Limit 245
Diode as RF Receiver (Video Detector) 249
RF and Microwave Range Receiver 254
Dicke Radiometer 258
Correlation Radiometer in the Microwave Range 261
Network Analyzer as a Noise Measurement Device 263
References 265
14 Equipment and Measurement Methods 267
Noise Measurement Receiver 267
Spectrum Analyzer 269
The Y-Method 273
Measurements in the Microwave Range 275
Selection Criteria of the Mixer 278
Image Rejection 279
Complete Noise Characterization 282
Analysis of Multi-impedance Measurements 283
Cold Source Method 285
The 7-State Method 287
On-Wafer Measurement of Cold Source 288
On-Wafer with Noise Generator According to the Y-method 293
References 296
15 Noise Generators 299
Vacuum Diode 299
Gas Discharge 300
Semiconductor Diodes 302
Excess Noise Ratio (ENR) 303
Hot-Cold Sources 305
References 307
16 Impedance Tuners 309
Impedance Transformation with Simple Methods 309
Mechanical Components for the Microwave Range 311
Electronic Components 313
Precision Automatic Tuner 315
Attenuation of the Tuner 317
References 318
17 Examples of Measurement Problems 319
Transistor in a Test Fixture 319
The Low Noise Block (LNB) of Satellite Television 322
Verification of a Noise Measurement 325
References 327
18 Measurement and Modeling of Low-Frequency Noise 329
Correlation Radiometer for Low Frequencies (f < 10 MHz) 329
The Low-Frequency Noise of Transistors 333
Measurement Setup for LF Noise 334
Examples of LF Noise Measurements on GaAs-HBT 336
Modeling of LF Noise 337
The Noise of the Microphone 337
References 342
19 Measurement Accuracy and Sources of Error 345
Accuracy of Measured Data 345
Error of Measurements 345
Inaccuracies of the Noise Measurement 346
Uncertainty of the ENR Calibration 349
Noise Source Mismatch 350
T0 = 290 K Is not TOFF 352
Mismatch in the System 353
Linearity of the Receiver 356
References 357
20 Phase Noise 359
Basics 359
Reciprocal Mixing 361
Description of Phase Noise 363
Spectral Power Density of Phase Fluctuations Sf (f) 364
The Single Sideband Phase Noise L(f) 365
Spectral Power Density of Frequency Fluctuations S¿f (f) 365
Excursus on Frequency and Phase Modulation 366
The Allan Variance s2Y (t) 368
Residual FM 370
Multiplication and Division 371
Amplitude Noise 371
Phase Noise and Jitter 372
References 374
21 Physics of the Oscillator 377
Oscillation Condition [1] 377
Simple Model of the Phase Disturbance [2] 378
Phase Slope, Resonator Quality, and Frequency Stability [3] 379
The Formula of Leeson [4] 382
Components of Oscillators 384
Influence of the Varactor Diode 386
Upward Mixing of LF Noise 390
The Influence of Microwave Noise on Phase Noise 393
References 396
22 Phase Noise Measurement 399
Basic Parameters 399
Spectrum Analyzer 399
Phase Detector Method 406
The Sensitivity of the Phase Detector 407
Example Calibration and Measurement 409
Keeping the Quadrature by a PLL 410
Delay Line as Frequency Discriminator 412
The Sensitivity of the Delay-Line Method 414
Configuration and Calibration 418
Resonator as Frequency Discriminator 420
Detection Limit 421
Comparison of Measurement Systems 422
Cross-Correlation Technique 423
Amplitude Noise 425
Problems with On-Wafer Measurement 429
Residual Phase Noise 430
References 432
Appendix 435
Noise Signals and Deterministic Signals 435
Random Signals 436
Characteristic Values 437
The Probability Density Function 438
Example Sine Function 439
Example Sawtooth Voltage 440
Example White Noise 440
Example Sinusoidal Signal with Noise 441
Example Narrowband Noise 441
The Autocorrelation Function 444
Example Sine 444
Example Sawtooth 444
Example Noisy Sine 445
Example White Noise 446
Example Low-Pass Noise 447
Example Bandpass Noise 449
Fourier Series 451
Sine-Cosine Spectrum 452
Amplitude-Phase Spectrum 452
Complex Fourier Series 452
The Fourier Integral 453
Energy and Power Signals 456
Example Transient Time Function 457
The Parseval Equation 459
Example Voltage Pulse 460
Fourier Transform and Power Spectral Density 462
Example Rectangular Pulse 463
Time-Limited Noise Signal 465
Example of a Time-Limited Wave Train 466
The Wiener-Khinchin Theorem 468
Cross Correlation 470
Example of Two Sine Functions 471
Example of Two White Noise Signals 472
Example of Two Bandpass Noise Signals 472
Example White Noise and Bandpass Noise 474
Cross-Correlation After Splitting into Two Branches 474
Power Spectral Density Real and Complex 477
The Cross-Spectral Density 478
Complex Representation of the Cross-Spectral Density 479
Transmission of Noise by Networks 479
References 485
Glossary of Symbols 487
Index 491
1
Introduction
Preliminary Remarks
The spontaneous fluctuations of voltages or currents that we deal with are summarized under the term electronic noise. This is a historical term from the early days of radio technology. In those days, listeners were delighted when they had a more or less interference-free reception. In the background, or when the receiver was slightly detuned, a disturbing noise could be heard. In the age of digital data transmission, this everyday acoustic noise has largely disappeared from radio and telephony. Noise need not always be of electronic origin. We can hear it, for example, from a mountain stream, when rain falls on a roof or when an air conditioning system is in operation. A clearly perceptible acoustic impression results from the summation of a plurality of randomly occurring individual processes.
Since the publication of the fundamental work "Noise" by A. van der Ziel in 1954 [1], a number of publications on the theory and practice of electronic noise have been published. In the books [2-8] the physical, mathematical aspect is in the foreground. For the practitioner of circuit design and measurement technology, the books [9-14] are more suitable.
The RF-engineer we are addressing here knows noise as a visual impression at the screen of a spectrum analyzer or broadband oscilloscope. Even without an external signal, the display shows a statistical fluctuation, the "noise floor." With an oscilloscope, this fluctuation can be seen in the time domain. When sweeping across the screen, the spot dithers irregularly around the baseline. In the spectrum analyzer it fluctuates around an average value. At first glance, the visual impression is the same. It is clear that such an irregularity, whose time dependence is obviously unrepeatable and unpredictable, can only be treated by means of the theory of fluctuation processes. It is indispensable to work with mean values, signal statistics, probability distributions, and correlation. In most cases, time averaging is used for analyses in the time domain, while in the frequency domain the ensemble average is used. Since the noise is ergodic, there is no difference between the two.
Before turning to the noise of amplifiers, receivers, and oscillators and its measurement, it is useful to understand what laws are hidden in this apparently completely chaotic process.
The reason for this is the atomistic structure of electricity. The electric current is not a continuous flow. It consists of the contributions of the individual elementary charges. Small irregular fluctuations are superimposed on the average value. This is also the case when the mean value is zero, i.e. no current flows. As a result of the thermal motion of the free electrons in the conductor, they generate a current pulse of the duration t when flying over the distance of a free path. This current pulse corresponds to a voltage pulse at the ends of the structure. These are very short voltage pulses in short succession. In a doped semiconductor we have, e.g. n = 1017 electrons/cm3. The free time of flight is about t = 10-12 seconds.
For a material die with a volume V of 10 µm edge length this results in z voltage impulses per second
(1.1)The voltage pulses generated by the individual processes are superimposed to thermal noise at the terminals of the structure. The observation of the fluctuation of the voltage at an ohmic resistance in the time domain due to the thermal motion of the electrons is therefore an obvious entry into the physics of noise processes. However, this fluctuating voltage cannot be observed without special measurement technology. Although the oscilloscope is the appropriate instrument for the time domain, it is usually not sensitive enough. The spot on the screen of an older, analog oscilloscope with, e.g. 100 MHz bandwidth, shows, even in the most sensitive range (5 mV/div), a completely smooth curve. No matter which resistor we connect to the input. A voltage fluctuating in time can only be seen on a high performance oscilloscope with extreme bandwidth. However, this noise voltage visible there is also not generated by the thermal noise of a resistor at the input, but by the amplifier chain in the device itself. Nevertheless one has a direct picture of a typical noise process in the time domain. An example is shown in Figure 1.1. Figure 1.1a is the noise voltage on the screen of a LeCroy Wave Expert SE 70 in the y-deviation 1 mV/div [15]. Figure 1.1b is the histogram of the voltage values together with the appropriate Gaussian distribution. This "elementary image" of the noise shows us some essential properties.
The mean value is zero. The amplitude distribution, the probability density function (PDF) follows the Gaussian curve. Thus one can define a standard deviation and thus an effective value of the noise voltage.
Before we deal with the origin of these vRMS = 2.8 mV and with the statistical quantities in detail, let us look at the screen of a spectrum analyzer. Unlike the oscilloscope, even the simplest model shows a noise floor. What at first glance looks the same on an oscilloscope and a spectrum analyzer turns out to be quite different on closer inspection. This is generally the case with noise observations. At the output of a communication system one has a disturbing noise floor. The contributions to this come from different sources and over a wide range of channels. If one wants to minimize them, one has to understand all the elementary processes and their interaction.
Figure 1.1 Screenshot of the noise level of a LeCroy 70 GHz oscilloscope. (a) Amplitude in the time domain. (b) Statistics of the voltage values. Gaussian distribution with vRMS = 2.8 mV.
Here we have a representation of the noise in the frequency domain. From the broadband noise spectrum we see a small section at the center frequency with the selected resolution bandwidth (RBW). This is not the "elementary picture" of noise as in Figure 1.1. The noise voltage in Figure 1.2 is characterized by two important networks. The IF filter with its RBW selects a narrow frequency range around the center frequency. The display is generated by a detector which displays the average value of the rectified noise voltage. The display is thus the result of data processing through a linear and a non-linear network. This also results in a change in the distribution of the amplitudes. Instead of the Gaussian distribution, we see a Rayleigh distribution on a logarithmic scale in the histogram Figure 1.2b. There is another important difference to Figure 1.1: On the spectrum analyzer [16] we see the noise from the noise. The actual noise level is the average value corresponding to the Rayleigh distribution. What we see is the remaining fluctuation that can be averaged out by reducing the video bandwidth (VBW). By reducing the VBW in relation to the RBW, the standard deviation is reduced (Figure 1.3).
Figure 1.2 Screenshot of a spectrum analyzer (a) and histogram (b).
Figure 1.3 Effect of reducing "noise from noise" by reducing video bandwidth.
Thus, by a longer averaging we can get a noise-free display of the noise. The most important use of the spectrum analyzer is to observe signals in the frequency domain. Very weak signals become visible when the noise is averaged out. Statistical considerations make it possible to optimize bandwidth and sweep time. The level we now measure is generated by the input attenuator, the mixer, and the IF amplifier. It is easy to observe that it is directly proportional to the RBW. The larger the RBW selected, the higher the noise level.
Electronic noise is present in every component of a transmitter-receiver system, i.e. a system for transmitting information. It physically limits the transmission possibilities, since a signal that is too weak "disappears" in the noise. Even in measuring instruments, e.g. spectrum analyzers or power meters, the detection limit is given by the inherent noise. Even the mirror galvanometers previously used as sensitive current meters showed thermally induced display jitter.
A measure of the level difference between signal PS and noise N is the signal-to-noise ratio SNR, which is usually given in dB.
(1.2)Table 1.1 Values of (signal to interference and noise ratio) for various applications.
Application Radar Mobile phone Entertainment, video games SNR (dB) +15 +18 +30Table 1.1 shows typical values for an electronic system limited only by the noise of the receiver.
A signal beyond recognition can also be caused by interfering signals that scatter into the receiving band. This can be explained...
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