
Principles of Electron Optics
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Content
- Front Cover
- Principles of Electron Optics: Wave Optics
- Copyright Page
- Contents
- Preface
- Chapter 54. Introduction
- 54.1 Organization of the subject
- 54.2 History
- PART XI - WAVE MECHANICS
- Chapter 55. The Schrödinger Equation
- 55.1 Introduction
- 55.2 Formulation of Schrödinger's equation
- 55.3 The continuity equation
- 55.4 The gauge transformation
- Chapter 56. The Relativistic Wave Equation
- 56.1 The Dirac equation
- 56.2 The scalar wave equation
- 56.3 Properties of the relativistic wave equation
- 56.4 Rigorous approach
- Chapter 57. The Eikonal Approximation
- 57.1 The product separation
- 57.2 The essential approximation
- 57.3 The variational principle
- 57.4 The calculation of eikonal functions
- 57.5 The calculation of wave amplitudes
- Chapter 58. Paraxial Wave Optics
- 58.1 The paraxial Schrödinger equation
- 58.2 Particular solution of the paraxial Schrödinger equation
- 58.3 Paraxial image formation
- Chapter 59. The General Theory of Electron Diffraction and Interference
- 59.1 Kirchhoff's general diffraction formula
- 59.2 Necessary simplifications
- 59.3 Fresnel and Fraunhofer diffraction
- 59.4 Electron diffraction in the presence of electromagnetic fields
- 59.5 Asymptotic diffraction formulae
- 59.6 The observability of diffraction and interference fringes
- Chapter 60. Elementary Diffraction Patterns
- 60.1 The object function
- 60.2 Rectangular structures
- 60.3 Circular structures
- 60.4 Caustic interferences
- 60.5 Diffraction disc with lens aberrations
- 60.6 The Rayleigh rule and criterion
- PART XII - ELECTRON INTERFERENCE AND ELECTRON HOLOGRAPHY
- Chapter 61. General Introduction
- Chapter 62. Principles of Interferometry
- 62.1 The electrostatic biprism
- 62.2 Quasi-homogeneous interference fringes
- 62.3 Coherence problems
- 62.4 The Aharonov-Bohm effect
- 62.5 Other electron interference studies
- Chapter 63. Principles of Holography
- 63.1 In-line holography
- 63.2 Off-axis holography: hologram formation in a two-beam interferometer
- 63.3 Reconstruction procedures
- 63.4 Further reading
- PART XIII - THEORY OF IMAGE FORMATION
- Chapter 64. General Introduction
- Chapter 65. Fundamentals of Transfer Theory
- 65.1 The integral transformation
- 65.2 Isoplanatism and Fourier transforms
- 65.3 The wave transfer function
- 65.4 Explicit formulae
- Chapter 66. The Theory of Bright-field Imaging
- 66.1 Image contrast for weak specimens
- 66.2 Spectral distributions of the illumination
- 66.3 Particular forms of the spectra
- 66.4 Optimum defocus and resolution limit
- 66.5 Extensions of the theory
- Chapter 67. Image Formation in the Scanning Transmission Electron Microscope
- 67.1 Introduction
- 67.2 Wave propagation in STEM
- 67.3 Detector geometry
- 67.4 Concluding remarks
- PART XIV - ELECTRON INTERACTIONS IN THIN SPECIMENS
- Chapter 68. Electron Interactions in Amorphous Specimens
- 68.1 Introduction
- 68.2 Definition of the elastic cross-sections
- 68.3 The first-order Born approximation for elastic scattering
- 68.4 The high-energy approximation
- 68.5 Partial wave analysis
- 68.6 Inelastic electron scattering
- 68.7 Plural and multiple electron scattering
- Chapter 69. Electron Interactions in Crystalline Specimens
- 69.1 Introduction
- 69.2 Fundamentals of crystallography
- 69.3 The periodic potential
- 69.4 Kinematic theory of electron scattering
- 69.5 General formulation of the dynamical theory
- 69.6 The two-beam case
- 69.7 Applications and extensions of the dynamical theory
- 69.8 Image simulation
- PART XV - DIGITAL IMAGE PROCESSING
- Chapter 70. Introduction
- 70.1 Organization of the subject
- 70.2 Image algebra
- 70.3 Notation
- Chapter 71. Acquisition, Sampling and Coding
- 71.1 Acquisition
- 71.2 Sampling
- 71.3 Quantization
- 71.4 Coding
- 71.5 Electron optical considerations
- Chapter 72. Enhancement
- 72.1 Operations on individual pixels
- 72.2 Linear filtering
- 72.3 Nonlinear filters
- 72.4 Image algebraic representation of enhancement
- 72.5 Enhancement in electron microscopy
- Chapter 73. Linear Restoration
- 73.1 Introduction
- 73.2 Extended Wiener filters
- 73.3 Filtering with constraints
- 73.4 Hoenders' procedure
- 73.5 Recursive filtering
- 73.6 Other approaches
- Chapter 74. Nonlinear Restoration
- 74.1 Introduction
- 74.2 Extended linear approximation
- 74.3 Multiple recordings (circular symmetry)
- 74.4 Analyticity
- 74.5 Maximum entropy and related probabilistic methods
- Chapter 75. Three-dimensional Reconstruction
- 75.1 Introduction
- 75.2 Methods
- 75.3 Pre-processing
- 75.4 Concluding remarks
- Chapter 76. Image Analysis
- 76.1 Introduction
- 76.2 Discrete geometry
- 76.3 Segmentation and feature extraction
- 76.4 Classification
- 76.5 Description
- 76.6 Further reading
- Chapter 77. Instrument Control and Instrumental Image Manipulation
- 77.1 Introduction
- 77.2 Measurement of microscope operating parameters
- 77.3 Control
- PART XVI - COHERENCE, BRIGHTNESS AND SPECTRAL FUNCTIONS
- Chapter 78. Coherence and the Brightness Functions
- 78.1 Introduction
- 78.2 Coherence
- 78.3 Radiometry
- 78.4 The brightness of partially coherent sources
- 78.5 Consequences for the van Cittert-Zernike theorem
- 78.6 Eigenfunction expansions of the coherence functions
- 78.7 The quasihomogeneous source
- 78.8 Brightness, coherence and quasihomogeneity
- 78.9 Temporal and spatial coherence
- 78.10 Related work
- Chapter 79. Instrumental Aspects of Coherence
- 79.1 Introduction
- 79.2 The propagation of coherence functions
- 79.3 Coherence and illumination
- Appendix
- Notes and References
- Index
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