
Simulation Methods for Esd Protection Development
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Content
- Front Cover
- Advanced Simulation Methods for ESD Protection Development
- Copyright Page
- Contents
- Preface
- Chapter 1. ESD basics
- 1.1 Introduction
- 1.2 The ESD event - models and testing
- 1.3 ESD failure mechanisms
- 1.4 Quantitative characterization methods
- Summary
- Bibliography
- Chapter 2. Parameters for an ESD protection concept
- 2.1 Introduction
- 2.2 Basic ESD protection concepts
- 2.3 Self-protection of FETs
- 2.4 Characteristics of protection devices
- 2.5 Requirements for a successful ESD protection concept
- Summary
- Bibliography
- Chapter 3. Simulation flow
- 3.1 ESD protection development strategy
- 3.2 Simulation based development flow
- Summary
- Bibliography
- Chapter 4. Process simulation
- 4.1 Introduction
- 4.2 The basics of the important process steps
- 4.3 Calibration of process technology parameters in a process simulator
- 4.4 Limitations of process simulation of ESD elements
- 4.5 Example of a process simulation of NFETs
- Summary
- Bibliography
- Chapter 5. ESD device simulation
- 5.1 Basics of device physics and modelling
- 5.2 Set-up procedure for ESD device simulation
- 5.3 Calibration of device simulation
- 5.4 Derivation of a pre-Si ESD protection concept
- 5.5 Device simulation of typical protection elements
- 5.6 Simulation of different ESD stress pulses
- 5.7 Limitations of ESD device simulation
- Summary
- Bibliography
- Chapter 6. ESD circuit simulation
- 6.1 Field of application
- 6.2 Compact models for analogue simulation
- 6.3 Basic compact models of protection devices
- 6.4 Compact models of FETs
- 6.5 Examples: circuit simulation of ESD problems
- 6.6 Limitations of ESD circuit simulation
- Summary
- Bibliography
- Chapter 7. Chip-level ESD verification
- 7.1 Goals
- 7.2 Verification methods
- 7.3 First steps to chip-level ESD simulation
- 7.4 Future Challenges for a chip-level ESD simulation
- Summary
- Bibliography
- Chapter 8. Outlook
- Appendix
- Symbols
- Abbreviations
- Index
- Colour section
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