High-Power Electromagnetic Effects on Electronic Systems
1st Edition
Published on 31. March 2020
320 pages
978-1-63081-589-9 (ISBN)
Description
This is the first book that comprehensively addresses the issues relating to the effects of radio frequency (RF) signals and the environment of electrical and electronic systems. It covers testing methods as well as methods to analyze radio frequency. The generation of high-powered electromagnetic (HPEM) environments, including moderate band damped sinusoidal radiators and hyperband radiating systems is explored. HPEM effects on component, circuit, sub-system electronics, as well as system level drawing are discussed. The effects of HPEM on experimental techniques and the standards which can be used to control tests are described. The validity of analytical techniques and computational modeling in a HPEM effects context is also discussed.Insight on HPEM effects experimental techniques and the standards which can be used to control tests is provided, and the validity of analytical techniques and computational modeling in a HPEM effects context is discussed. This book dispels myths, clarifies good experimental practice and ultimately draws conclusions on the HPEM interaction with electronics. Readers will learn to consider the importance of HPEM phenomena as a threat to modern electronic based technologies which underpin society and to therefore be pre-emptive in the consideration of HPEM resilience.
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Other editions
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D.V. Giri | Richard Hoad | Frank Sabath
High-Power Radio Frequency Effects on Electronic Systems
Book
03/2020
Artech House Publishers
€169.32
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Content
- High-Power Electromagnetic Effects on Electronic Systems
- Contents
- Foreword
- Acknowledgments
- 1 Introduction
- 1.1 Reliance on Electronics
- 1.2 HPEM Environment Overview
- 1.3 HPEM Effects Overview
- 1.4 A Brief History of EM Interference and Effects
- 1.5 A Systems-of-Systems Hierarchy
- 1.5.1 Device
- 1.5.2 Circuit
- 1.5.3 Equipment
- 1.5.4 System
- 1.5.5 Network
- 1.5.6 Infrastructure
- 1.6 Summary
- References
- 2 HPEM Environments
- 2.1 Introduction
- 2.2 Lightning
- 2.2.1 Overview
- 2.2.2 Lightning-Radiated Environment
- 2.3 Nuclear EM Pulse
- 2.3.1 HEMP-Radiated Environment
- 2.3.2 HEMP-Conducted Environment
- 2.3.3 Open-Source Accounts of HEMP Disturbances
- 2.3.4 HEMP Environment Summary
- 2.4 High-Power RF Directed Energy Environments
- 2.4.1 The Status of HPRF DE Systems Today
- 2.5 Intentional EM Interference Environments
- 2.5.1 IEMI Technical Capability Groups
- 2.5.2 IEMI Environment Summary
- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action
- 2.6 Classification of HPRF DE and IEMI Environments
- 2.6.1 Hypoband
- 2.6.2 Mesoband
- 2.6.3 Hyperband
- 2.7 Summary
- References
- 3 HPEM Coupling and Interaction
- 3.1 EM Interaction Coupling Model
- 3.2 Topological Concept
- 3.3 Transfer Functions
- 3.3.1 Antenna Transfer Function
- 3.3.2 Free-Space Wave Propagation
- 3.3.3 Coupling/Radiation Efficiency
- 3.3.4 Diffusion Penetration
- 3.3.5 Aperture Penetration
- 3.3.6 Conducted Propagation
- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling
- 3.3.8 Capacitive Coupling
- 3.3.9 Inductive Coupling
- 3.4 Field Variation Inside System Enclosure
- 3.5 Overall Response
- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure
- 3.5.2 Coupling as a Function of HPEM Environment Type
- References
- 4 Overview of HPEM Test Facilities and Techniques
- 4.1 Introduction
- 4.1.1 General Considerations for the Scenario
- 4.1.2 General Considerations for HPEM Environment Simulation
- 4.1.3 General Considerations of the SUT
- 4.1.4 Summary
- 4.2 Uncertainty in Effects Testing
- 4.3 HPEM Effects Test Methods and Facilities
- 4.3.1 HPEM-Radiated Testing
- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation
- 4.3.3 Measuring the Radiated HPEM Environment
- 4.3.4 The Measurement Chain
- 4.3.5 HPEM Conducted Testing
- 4.3.6 Measuring the Conducted HPEM Environment
- 4.4 Exercising and Observing the SUT
- 4.5 Effects Data Presentation
- 4.6 Other Practical Considerations for HPEM Effects Testing
- 4.7 Summary
- References
- 5 HPEM Effects Mechanisms
- 5.1 Introduction
- 5.2 Terminology
- 5.2.1 About This Chapter
- 5.3 Device and Circuit-Level Effects
- 5.3.1 Rectification
- 5.3.2 Noise
- 5.3.3 Interference or Jamming
- 5.3.4 Saturation
- 5.3.5 Shift in Operating Point
- 5.3.6 False Information
- 5.3.7 Transient Upset
- 5.3.8 Chaotic Effects
- 5.3.9 Damage and Destruction
- 5.3.10 Published Device and Circuit-Level Effects Data
- 5.4 Equipment, System, and Network-Level Effects
- 5.4.1 Summary of Equipment, System, and Network-Level Effects
- 5.5 HPEM Signal Indicators
- 5.5.1 Transient or Time-Domain Signal Indicators
- 5.5.2 Frequency-Domain Signal Indicators
- 5.5.3 Pulsed CW Signals
- 5.5.4 Use of Response Indicators
- 5.6 Impact of Signal Indicators on HPEM Effect Mechanisms
- 5.6.1 Effects of Pulse Repetition: Charging and Heating
- 5.6.2 Effects of Pulse Repetition: Thermal Damage
- 5.6.3 Effects of Pulse Repetition: Probability of Intercept
- 5.6.4 Effects of Spectral Density
- 5.7 Summary
- References
- 6 Classification and Implications of HPEM Effects
- 6.1 Introduction
- 6.2 Classification of EM Effects
- 6.2.1 Effect Classification by Mechanism
- 6.2.2 Effect Classification by Duration
- 6.2.3 Effect Classification by Criticality
- 6.3 Conclusions
- References
- 7 HPEM Protection Concepts and Methods
- 7.1 Introduction
- 7.2 Shielding Topology Protection Concept
- 7.2.1 Shielding Topology Modeling
- 7.2.2 Shielding Mechanisms
- 7.3 Conducted Protection Via Nonlinear Elements
- 7.3.1 Protection Using the Amplitude Reduction Approach
- 7.3.2 Summary of Analysis of Nonlinear Elements
- 7.4 HPEM Resilience and Detection
- 7.4.1 A Risk-Based Approach
- 7.4.2 A Resilience Approach
- 7.4.3 HPEM Detection
- 7.5 HPEM Standards
- 7.5.1 HPEM Standards Organization
- 7.6 Summary
- References
- 8 Epilogue
- References
- Glossary
- About the Authors
- Index
