Fault Detection and Diagnosis in Engineering Systems
Published on 22. November 2017
504 pages
978-1-351-44879-6 (ISBN)
Description
Featuring a model-based approach to fault detection and diagnosis in engineering systems, this book contains up-to-date, practical information on preventing product deterioration, performance degradation and major machinery damage.;College or university bookstores may order five or more copies at a special student price. Price is available upon request.
Reviews / Votes
". . .This book is devoted to the model-based approach, focusing on dynamic consistency (parity) relations and parameter estimation. The work is partly based on the author's own research contributions and provides a unified treatment of the subject, revealing the equivalence of seemingly different approaches (parity relations vs parameter estimation). The book makes a significant contribution to the FDD literature. "---The International Journal of Electrical Engineering Education
More details
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
File size
17,26 MB
ISBN-13
978-1-351-44879-6 (9781351448796)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Janos Gertler
Fault Detection and Diagnosis in Engineering Systems
Book
09/2019
1st Edition
CRC Press
€102.30
Shipment within 15-20 days
Janos Gertler
Fault Detection and Diagnosis in Engineering Systems
Book
05/1998
1st Edition
CRC Press
€461.50
Shipment within 15-20 days
Person
Gertler, Janos
Content
Introduction to fault detection and diagnosis; discrete linear systems; random variables; parameter estimation fundamentals; analytical redundancy concepts; parity equation implementation of residual generators; design for structured residuals; design for directional residuals; residual generation for parametric faults; robustness in residual generation; statistical testing of residuals; model identification for the diagnosis of additive faults; diagnosing multiplicative faults by parameter estimation.
