Cover: RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors - SciTech Publishing Inc

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Jianjun Gao(Author)
SciTech Publishing Inc
1st Edition
Published on 14. May 2014
350 pages
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978-1-61353-090-0 (ISBN)
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