Progress in Microscopy

ForewordChapter I. Physical Aspects of Image Formation in Microscopy 1. Introduction 2. Image of a Luminous Point Exhibited by the Objective of a Microscope in Monochromatic Light 3. Image of a Luminous Point Originated by a Reflecting Objective 4. Image of a Luminous Point When the Microscope is Not Properly Focused (Monochromatic Light) 5. Image of a Luminous Point in White Light 6. Luminous Point Imaged in the Presence of Aberrations 7. Objects in Coherent, Incoherent and Partially Coherent Illumination 8. Extended Objects Imaged in Incoherent Illumination 9. Extended Objects Imaged in Coherent and Partially Coherent Illumination 10. Perception Limit and Resolving Power 11. Stray Light 12. Reducing the Grain of Photographic ImagesChapter II. Phase-Contrast Microscopy 1. Transparent Objects 2. Principle of the Phase-Contrast Method 3. Contrast and Sensitiveness of the Method 4. Image Structure in Phase-Contrast 5. Perception Limit and Resolving Power. Effects of Stray Light 6. Phase-Contrast Microscopes in Transmitted Light 7. Phase-Contrast ApplicationsChapter III. Interference Microscopy in Transmitted Light 1. Object and Fundamentals of Interference Microscopy 2. Fundamentals of Two-Wave Interference Microscopes 3. Dyson's Interference Microscope 4. Leitz's Interference Microscope 5. Polarization Interference Microscopes 6. Theoretical Principle of Polarizing Interference Microscopes 7. Smith's Full Image Duplication Interference Microscope 8. Françon's Compensated Interference Eyepiece 9. L. P. Johansson's Interferometer Eyepiece 10. Nomarski's Interference Microscope 11. Axial Image Duplication Interference Microscopes 12. Multi-Wave Interference Microscopes 13. Menzel's Interference Microscope 14. Sensitivity of Interference MicroscopesChapter IV. Reflected-Light Microscopy 1. Methods Applied in Reflected-Light Microscopy 2. Reflected-Light Phase-Contrast. Jupnik, Osterberg and Pride Phase Microscope. Françon, Nomarski, Bendford Seidenberg Layouts 3. Oblique Illumination and Dark Ground in Reflected Light. Schmaltz's Slit, Menzel's Method 4. Reflected-Light Interference Microscopes: Sagnac, Linnik-Zeiss, Krug And Lau, Hilger and Watt, Baker, Mirau, Dyson, Françon, Nomarski. Multi-Wave Layouts 5. Observation in Polarized Light 6. Scrutinizing of Hot-Metal SurfacesChapter V. Geometrical Measurements 1. Settings in Microscopy 2. Setting Accuracy 3. Measuring a Length in a Focusing Plane by Means of Two Transverse Settings 4. Measuring a Thin Object by Two Axial Settings 5. Measuring a Length Whose Ends Do Not Lie in the Same Focusing Plane 6. Measuring Small Areas and Volumes 7. Determining the Normal in a Point of a Small Reflecting Surface 8. High Precision-Measurement MicroscopesChapter VI. Measuring Refraction Indices of Transparent Objects: Unpolarized Two-Wave Interference Microscopes 1. Measuring Path Differences 2. Determining the Refraction Index From Path Difference MeasurementChapter VII. Measuring Refraction Indices of Transparent Objects: Polarizing Interference Microscopes Application of the Full-Duplication Method 1. Measuring Path Differences by Means of the Flat-Tints Process (Full-Duplication Process) 2. Measuring Path Differences, Applying the Fringes Process (Full-Duplication Process) 3. Determining the Refraction Index from Path-Difference Measurement (Full-Duplication Process) 4. Measuring the Refraction Index of Liquids (Full-Duplication Process) Application of the Differential Method 5. Measuring Path Difference Using the Flat-Tints Method (Differential Process) 6. Fringe-Shift Path-Difference Measurements (Differential Process) 7. Determining the Refraction Index from Path-Difference Measurements 8.