
SIMS Diffusion Studies
David J. Fisher(Editor)
Trans Tech Publications Ltd (Publisher)
Published on 8. November 2013
450 pages
978-3-03826-335-7 (ISBN)
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During the past 40 years, secondary ion mass spectrometry (SIMS) has become increasingly more popular for measuring diffusivities because it avoids the handling problems, environmental concerns and shortage of suitable isotopes which are associated with the use of radioactive tracer methods. It is the most sensitive of all the standard surface analytical techniques, and is capable of detecting impurity elements at less than 1ppm concentration, and bulk impurity concentrations of around 1ppb in certain cases. The sample surface is bombarded with high-energy ions, leading to the ejection of neutral and charged species. The latter can include atoms, clusters of atoms and molecular fragments. Static SIMS is used for sub-monolayer elemental analysis, dynamic SIMS is used for investigating composition as a function of depth below the surface and imaging SIMS is used for spatially-resolved elemental analysis. Static SIMS plus time-of-flight analysis, rather than the usual quadrupole mass analysis, permits a more exact quantitative analysis of specimens. The present compilation of nearly 800 items covers a selection of mainly-quantitative results, obtained using secondary ion mass spectrometry, for diffusivities in a wide range of materials.
More details
Series
Language
English
Place of publication
Zurich-Durnten
Switzerland
Target group
Professional and scholarly
Illustrations
Illustrations
File size
13,94 MB
ISBN-13
978-3-03826-335-7 (9783038263357)
DOI
10.4028/b-zwuAz6
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
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David J. Fisher
SIMS Diffusion Studies
Book
01/2014
Trans Tech Publications Ltd
€184.46
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David J. Fisher
SIMS Diffusion Studies
Software
01/2014
Trans Tech Publications Ltd
€165.22
Shipment within 10-15 days
Content
- Intro
- SIMS Diffusion Studies
- Table of Contents
- Abstracts
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