X-Ray Diffraction by Disordered Lamellar Structures

1 Overall Description of Imperfect Lamellar Crystals.- 1.1 Some Reminders on the Specific Characteristics of Crystals with a Triperiodic Structure.- 1.2 Range of Validity of the Direct Methods of Structural Analysis.- 1.3 Indirect Structural Analysis of Partially Disordered Lamellar Systems. Principles of Their Modelization.- 1.4 Determination of the Structural Characteristics of the Layers.- 1.5 General Characteristics of Triperiodic Layer Stackings.- 1.6 Principal Characteristics of Lamellar Structures with Stacking Faults.- 1.7 Principal Characteristics of Interstratified Minerals.- 1.8 Commensurate and Incommensurate Structures in Interstratified Systems.- References.- 2 Theory of the Diffraction Phenomenon Produced by Powders of Microcrystals with a Lamellar Structure.- 2.1 Diffraction from an Isolated Layer of Finite Extent.- 2.2 Diffraction from a Defect-Free Stack of Identical Layers.- 2.3 Diffraction by a Powder of Particles with Totally Random Orientation.- 2.4 Diffraction from a Powder of Partially Oriented Particles.- References.- 3 Diffraction from Lamellar Crystals with Stacking Faults.- 3.1 General Expression for the Diffraction Produced by Stacks of Layers with Position Defects.- 3.2 Diffraction Produced by Stacks Containing Rotation or Translation Faults Without Mutual Interaction.- 3.3 Diffraction Produced by Stacks with Defects Due to Fluctuations in the Positions of the Layers.- References.- 4 Statistical Models and Parameters Used to Describe Interstratified Lamellar Systems.- 4.1 General Parameters Characterizing the Stacking of Different Layers in Interstratified Structures.- 4.2 Interstratified Structures with S = 0.- 4.3 Interstratified Structures with S = 1.- 4.4 Interstratified Structures with S = 2.- 4.5 Interstratified Structures with S = 3.- 4.6 Degree of Homogeneity for Powders of Thin Particles with Markovian Interstratification (Quasi-Homogeneous System).- 4.7 Parameters for the Characterization of Homogeneous Interstratified Systems.- 4.7.1 Homogeneous Two-Component (A and B) Systems with S = 0.- 4.7.2 Homogeneous Two-Component Systems with S ? 0 and Restrictive Conditions for the Sequence of Layers.- References.- 5 Diffraction Methods Adapted to the Structural Analysis of Interstratified Systems.- 5.1 Direct Methods of Structural Analysis.- 5.2 Indirect Methods of Structural Analysis Based on the Computation of the Intensities of Basal Reflections.- 5.3 Diffraction by Systems with g Types of Layers, with a Specific Translation r Between the Adjacent i-Type and j-Type Layers, for any Given Value of S.- 5.4 Intensity of the Wave Diffracted by Systems with g Types of Layers, for any Value of S and R.- 5.5 General Remarks.- References.- 6 Experimental Techniques Adapted to the Study of Microdivided Lamellar Systems.- 6.1 Survey of the Techniques Most Frequently Used in Powder Diffractometry.- 6.2 Adaptation of Transmission Techniques to the Study of Microdivided Lamellar Systems.- 6.3 Perturbing Factors which can be Minimized.- 6.4 Principal Corrections on the Diffraction Patterns.- 6.5 Perturbing Factors Introduced in the Computation of the Theoretical Diffractograms.- 6.6 Determination of the Absolute Intensity Scale.- References.- 7 Structural Characteristics of Carbons.- 7.1 General Characteristics of Carbon Materials.- 7.2 Structural Characteristics of the Graphitization Process.- 7.3 Organization of the Stacks.- References.- 8 The Modelization Method in the Determination of the Structural Characteristics of Some Layer Silicates: Internal Structure of the Layers, Nature and Distribution of theStacking Faults.- 8.1 Structural Defects in Kaolinite.- 8.2 Distribution of the Cations in the cis and trans Octahedral Sites of Dioctahedral Smectites.- 8.3 Determination of the Distribution of Cations and Water Molecules in the Interlamellar Spaces of Dioctahedral Smectites.- 8.4 Structural Defects in Glauconites.- References.- 9 Determination of the Structural Characteristics of Mixed-Layer Minerals.- 9.1 The Method of D'yakonov.- 9.2 General Guidelines for the Use of Modelization of X-Ray Diffractograms in the Study of Mixed-Layer Minerals.- 9.3 Calculation of the Reference X-Ray Diffractogram for Quasi-Homogeneous Interstratified Minerals.- 9.4 Parameters Other than W and S which Influence the Profile of the Calculated X-Ray Diagrams of Two-Component Interstratified Systems.- 9.5 Quantitative Determination of the Structural Characteristics of Interstratified Dioctahedral Mica-Smectite Minerals.- 9.6 Semi-Quantitative Determinations of the Structural Characteristics of Interstratified Minerals.- References.- Author Index.