Random Testing of Digital Circuits
Theory and Applications
1st Edition
Published on 25. November 2020
496 pages
978-1-000-11016-6 (ISBN)
Description
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Reviews / Votes
"This book is based on the author's work in the area of random pattern testing. . .It is well based in mathematics, which is very refreshing to read. . .With the analytical tools developed in this book you will be taken through the frontier of random pattern testing from the very fundamentals right up to very useful concepts, which can be applied in today's design to many very useful techniques. "---T.W. Williams, University of Hannover and IBM, Hannover, Germany
". . .Rene David presents a broad spectrum of topics on random testing of digital circuits at a level accessible to undergraduate students, and yet challenging for advanced graduate students and engineers working in industry. The book is well written, readable, reliable and accurate. It is a gem. It should be on the shelf (and not only there!) of all professionals dealing with digital testing."
---Test Technology Newsletter of the IEEE Computer Society
". . .David's book will be valuable (especially graduate) students because it is clearly written and well structured, and includes recent scientific results. It will also serve as a reference book for experts because it summarizes work that is scattered among the journals and conference proceedings."
---Interfaces
More details
Edition
1. Auflage
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
ISBN-13
978-1-000-11016-6 (9781000110166)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Book
04/1998
1st Edition
CRC Press
€427.10
Shipment within 15-20 days
Person
Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France.
Content
Random testing and built-in self-test; models for digital circuits and fault models; basic concepts and test generation methods; performance measurements for a test sequence; basic principles of random testing; random test length for combinational circuits; random test length for sequential circuits; random test length for RAMs; random test length for microprocessors; generation of random test sequences; experimental results; signature analysis; design for random testability; appendices - A - random pattern sources, B - calculation of a probability of complete fault coverage, C - finite Markov chains, D - black-box fault model, E - exact calculation of activities, F - comparing asynchronous and synchronous test, G - proofs of properties 7.1, 7.2 and 12.3, H - microprocessor Motorola 6800, I - pseudorandom testing, J - random testing of delay faults, K - subsequences of required lengths, L - diagnosis from random testing, M - conjecture about multiple faults; exercises; solutions to exercises.
