Memory, Microprocessor, and ASIC
Published on 26. March 2003
384 pages
978-0-203-01023-5 (ISBN)
Description
Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
More details
Language
English
Place of publication
Baton Rouge
United States
Publishing group
Taylor & Francis Inc
Target group
Professional and scholarly
Student and professional electrical engineers specializing in VLSI, circuits & devices, controls, electronics, or communications
Illustrations
277 s/w Abbildungen, 33 s/w Tabellen
277 b/w images and 33 tables
File size
7,75 MB
ISBN-13
978-0-203-01023-5 (9780203010235)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Wai-Kai Chen
Memory, Microprocessor, and ASIC
Book
03/2003
1st Edition
CRC Press
€250.70
Shipment within 15-20 days
Person
Content
System Timing. ROM/PROM/EPROM. SRAM. Embedded Memory. Flash Memories. Dynamic Random Access Memory. Low-Power Memory Circuits. Timing and Signal Integrity Analysis. Microprocessor Design Verification. Microprocessor Layout Method. Architecture. ASIC Design. Logic Synthesis for Field Programmable Gate Array (EPGA) Technology. Testability Concepts and DFT. ATPG and BIST. CAD Tools for BIST/DFT and Delay Faults.
