Introduction to Scanning Tunneling Microscopy
1st Edition
Published on 29. July 1993
469 pages
978-0-19-802356-2 (ISBN)
Description
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
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05/1993
Oxford University Press Inc
€196.80
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Content
- Intro
- Contents
- List of Figures
- Gallery of STM Images
- 1 Overview
- 1.1 The scanning tunneling microscope in a nutshell
- 1.2 Tunneling: an elementary model
- 1.3 Probing electronic structure at an atomic scale
- 1.3.1 Semiconductors
- 1.3.2 Metals
- 1.3.3 Organic molecules
- 1.3.4 Layered materials
- 1.4 Spatially resolved tunneling spectroscopy
- 1.5 Lateral resolution: Early theories
- 1.5.1 The Stall Formula
- 1.5.2 The s-wave-tip model
- 1.6 Origin of atomic resolution in STM
- 1.7 Tip-sample interaction effects
- 1.8 Historical remarks
- 1.8.1 Imaging individual atoms
- 1.8.2 Metal-vacuum-metal tunneling
- PART I: IMAGING MECHANISM
- 2 Atom-scale tunneling
- 2.1 Introduction
- 2.2 The perturbation approach
- 2.3 The image force
- 2.4 The Square-barrier problem
- 2.5 The modified Bardeen approach
- 2.6 Effect of image force on tunneling
- 3 Tunneling matrix elements
- 3.1 Introduction
- 3.2 Tip wavefunctions
- 3.3 Green's function and tip wavefunctions
- 3.4 The derivative rule: individual cases
- 3.5 The derivative rule: general case
- 3.6 An intuitive interpretation
- 4 Wavefunctions at surfaces
- 4.1 Types of surface wavefunctions
- 4.2 The jellium model
- 4.3 Concept of surface states
- 4.4 Field emission spectroscopy
- 4.5 Photoemission studies
- 4.6 Atom-beam diffraction
- 4.7 First-principles theoretical studies
- 5 Imaging crystalline surfaces
- 5.1 Types of STM images
- 5.2 Surfaces with one-dimensional corrugation
- 5.3 Surfaces with tetragonal symmetry
- 5.4 Surfaces with hexagonal or trigonal symmetry
- 5.5 Corrugation inversion
- 5.6 The s-wave-tip model
- 6 Imaging atomic states
- 6.1 Slater atomic wavefunctions
- 6.2 Profiles of atomic states as seen by STM
- 6.3 The Na-atom-tip model
- 6.4 Images of surfaces: Independent-orbital approximation
- 7 Atomic forces and tunneling
- 7.1 Effect of atomic force in STM
- 7.2 Attractive atomic force as a tunneling phenomenon
- 7.3 Attractive atomic force and tunneling conductance
- 8 Tip-sample interactions
- 8.1 Local modification of sample wavefunction
- 8.2 Deformation of tip and sample surface
- PART II : INSTRUMENTATION
- 9 Piezoelectric scanner
- 9.1 Piezoelectric effect
- 9.2 Lead zirconate titanate ceramics
- 9.3 Tripod scanner
- 9.4 Bimorph
- 9.5 Tube scanner
- 9.6 In situ testing and calibration
- 9.7 Resonance frequencies
- 9.8 Repoling a depoled piezo
- 10 Vibration isolation
- 10.1 Basic concepts
- 10.2 Environment vibration
- 10.3 Suspension springs
- 10.4 Stacked plate - elastomer system
- 10.5 Pneumatic systems
- 11 Electronics and control
- 11.1 Current amplifier
- 11.2 Feedback circuit
- 11.3 Computer interface
- 12 Coarse positioner and STM design
- 12.1 The louse
- 12.2 Level motion-demagnifier
- 12.3 Single-tube STM
- 12.4 Spring motion demagnifier
- 12.5 Inertial steppers
- 12.6 The lnchworm®
- 13 Tip treatment
- 13.1 Introduction
- 13.2 Electrochemical tip etching
- 13.3 Ex situ tip treatments
- 13.4 In situ tip treatments
- 14 Scanning tunneling spectroscopy
- 14.1 Electronics for scanning tunneling spectroscopy
- 14.2 Nature of the observed tunneling spectra
- 14.3 Tip treatment for spectroscopy studies
- 14.4 The Feenstra parameter
- 14.5 Ex situ determination of the tip DOS
- 14.6 In situ determination of tip DOS
- 15 Atomic force microscopy
- 15.1 Introduction
- 15.2 Tip and cantilever
- 15.3 Deflection detection methods
- 15.4 AFM at the liquid-solid interface
- 16 Illustrative applications
- 16.1 Surface structure determination
- 16.2 Nucleation and crystal growth
- 16.3 Local tunneling spectra of superconductors
- 16.4 Surface chemistry
- 16.5 Organic molecules
- 16.6 Electrochemistry
- 16.7 Biological applications
- Appendix A: Real wavefunctions
- Appendix B: Green's functions
- Appendix C: Spherical modified Bessel functions
- Appendix D: Two-dimensional Fourier series
- Appendix E: Plane groups and invariant functions
- E.I A brief summary of plane groups
- E.2 Invariant functions
- Appendix F: Elementary elasticity theory
- F.1 Normal stress and normal strain
- F.2 Shear stress and shear strain
- F.3 Small deflection of beams
- F.4 Vibration of beams
- F.5 Torsion
- F.6 Helical springs
- F.7 Contact stress: The Hertz formulas
- Appendix G: A short table of Laplace transforms
- Appendix H: Operational amplifiers
- References
- Index
- A
- B
- C
- D
- E
- F
- G
- H
- I
- J
- K
- L
- M
- N
- O
- P
- Q
- R
- S
- T
- U
- V
- W
- Y
