Concise Encyclopedia of Materials Characterization
Published on 22. January 2016
670 pages
978-1-4832-8751-5 (ISBN)
Description
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this.Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general.The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques.This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
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R. W. Cahn | Eric Lifshin
Concise Encyclopedia of Materials Characterization
Book
12/1992
Pergamon
€190.04
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Content
Selected articles: Acoustic emission. Acoustic microscopy. Anodization spectroscopy. Art forgeries: scientific detection. Atomic force microscopy. Auger electron spectroscopy. Auger microscopy, angular distribution. Ceramic materials: cathodoluminescence analysis. Composite materials: nondestructive evaluation. Confocal optical microscopy. Corrosion and oxidation study techniques. Depth profiling. Elastomers: spectroscopic characterization. Electron diffraction. Electron diffraction, low-energy. Electron energy-loss spectrometry. Electron microprobe analysis. Electron microscopy, high-resolution. Electron spin resonance. Electron tunnelling spectroscopy. Field-ion microscopy: observation of radiation effects. Fractals. Gamma radiography. Grain size: nondestructive evaluation. Hardness characterization. Infrared spectroscopy. Junction transient spectroscopy. Laser microprobe mass spectrometry. Laser sampling inductively coupled plasma mass spectrometry. Liquid chromatography mass spectroscopy. Magnetic materials: measurements. Microengineering of materials: characterization. Neutron radiography. Nuclear magnetic resonance spectroscopy. Optical calorimetry. Optical emission spectroscopy. Particle-induced x-ray emission. Polymers: electron microscopy. Polymers: neutron scattering. Polymers: tests for mechanical properties. Porosity: characterization and investigation. Raman spectroscopy. Residual stresses: measurement using neutron diffraction. Scanning tunnelling microscopy and spectroscopy. Semiconducting materials: characterization by etching. Single-crystal x-ray diffraction. Small-angle neutron scattering in metallurgy. Solid state: study using muon beams. Stress distribution: analysis using thermoelastic effect. Thermal wave imaging. Thermophysical measurements, subsecond. Vibrothermography. Wood: acoustic emission and acousto-ultrasonic characteristics. X-ray and neutron diffraction studies of amorphous solids. X-ray diffraction, time-resolved. X-ray powder diffraction.numerous illus., 900 lit. refs.
