
PCB Design Guide to Via and Trace Currents and Temperatures
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Content
- Intro
- Contents
- Preface
- Technical Note: TRM
- Acknowledgments
- Chapter 1 Introduction and Historical Background
- 1.1 Bottom Line
- 1.2 Historical Background
- 1.3 A Note about Consistency
- End Notes
- Chapter 2 Materials Used in PCBs
- 2.1 Bottom Line
- 2.2 Background
- 2.3 Copper Used in PCBs
- 2.3.1 Copper-clad laminates
- 2.3.2 Copper Plating Manufacturing Step
- 2.3.3 Copper Resistivity
- 2.3.4 Summary
- 2.4 Dielectrics Used in PCBs
- 2.4.1 Thermal Conductivity (Tcon or k)
- 2.4.2 Glass Transition Temperature (Tg)
- 2.4.3 Decomposition Temperature (Td)
- 2.4.4 Time to Delamination (T260/T288)
- 2.4.5 Summary
- End Notes
- Chapter 3 Resistivity and Resistance
- 3.1 Bottom Line
- 3.2 Resistivity
- 3.3 Resistance
- 3.4 Thermal Coefficient of Resistivity (a)
- 3.5 Measuring Resistivity
- 3.5.1 Resistivity Investigation
- 3.5.2 Nondestructive Measurements
- End Notes
- Chapter 4 Trace Heating and Cooling
- 4.1 Bottom Line
- 4.2 Overview
- 4.3 Trace Heating
- 4.3.1 Power and Energy
- 4.3.2 Trace Heating
- 4.4 Trace Cooling
- 4.4.1 Conductive Cooling
- 4.5 Mathematical Model of Trace Heating and Cooling
- 4.6 Role of Current Density
- 4.7 Measuring Trace Temperature
- 4.7.1 IPC Procedure
- 4.7.2 Infrared Measurement
- 4.7.3 Thermocouple Measurement
- 4.7.4 Point versus Average Measurements
- 4.8 Trace Temperature Curves
- 4.8.1 Typical Curve
- 4.8.2 Heavy Overload
- 4.8.3 Marginal Overload
- End Notes
- Chapter 5 IPC Curves
- 5.1 Bottom Line
- 5.2 IPC-2152
- 5.3 Measuring the Temperature
- 5.4 IPC Curves
- 5.4.1 External Results
- 5.4.2 External IPC Data Equations
- 5.4.3 Internal IPC Data Equations
- 5.4.4 IPC Vacuum Data
- End Notes
- Chapter 6 Thermal Simulations
- 6.1 Bottom Line
- 6.2 Background
- 6.3 Modeling Traces
- 6.4 The Modeling Process
- End Notes
- Chapter 7 Thermal Simulations
- 7.1 Bottom Line
- 7.2 Sensitivities: Layout Parameters
- 7.2.1 Small Trace Widths
- 7.2.2 Transient Response
- 7.2.3 Thermal Gradients
- 7.2.4 Changing Trace Length
- 7.2.5 Dimensional Uncertainties
- 7.2.6 Presence of Planes
- 7.2.7 Adjacent Trace
- 7.2.8 Adjacent Trace with Underlying Pla
- 7.2.9 Parallel Power Traces
- 7.2.10 Stacked Power Traces
- 7.2.11 Air Flow
- 7.2.12 Summary
- 7.3 Sensitivities: Material Parameters
- 7.3.1 Board Thickness and Planes
- 7.3.2 Effect of Resistivity
- 7.3.3 Effect of Heat Transfer Coefficien
- 7.3.4 Effects of Thermal Conductivity Co
- 7.3.5 Effect of Trace Thickness
- 7.3.6 Summary
- 7.4 Sensitivities: Trace Depth
- 7.5 Conclusions
- 7.5.1 Call to Action
- End Notes
- Chapter 7 Via Temperatures
- 8.1 Bottom Line
- 8.2 Background Information
- 8.3 Thermal Simulation
- 8.3.1 Simulation Strategy
- 8.3.2 Board Model
- 8.3.3 First Simulation
- 8.3.4 Additional Simulations
- 8.3.5 Two Vias
- 8.3.6 Conclusion
- 8.4 Experimental Verification
- 8.4.1 Simulation
- 8.4.2 Simulation Results
- 8.5 Experimental Results
- 8.5.1 Measured Results
- 8.5.2 Conclusion
- 8.6 Voltage Drop Across Trace and Via
- 8.6.1 Summary
- 8.7 Thermal Vias
- 8.7.1 Special Via
- 8.7.2 Conclusion
- End Notes
- Chapter 9 Current Densities in Vias
- 9.1 Bottom Line
- 9.2 Background
- 9.3 Single Via
- 9.4 Multiple Vias
- 9.5 Multiple Vias and Turn
- 9.6 Conclusions
- End Notes
- Chapter 10 Thinking Outside the Boxes
- 10.1 Bottom Line
- 10.2 Start Thinking Outside Our Boxes
- 10.3 Test Board
- 10.4 Copper Under the Trace
- 10.4.1 Discussion
- 10.5 Adding Additional Copper to Traces
- 10.5.1 Discussion
- 10.6 Dealing with Connecting Links
- 10.6.1 Discussion
- 10.7 Conclusions
- End Notes
- Chapter 11 Fusing Currents: Background
- 11.1 Bottom Line
- 11.2 Background
- 11.3 W. H. Preece
- 11.4 I. M. Onderdonk
- 11.4.1 Cautions
- End Notes
- Chapter 12 Fusing Currents: Analyses
- 12.1 Bottom Line
- 12.2 Background
- 12.3 Fusing Time and Temperature
- 12.4 Assumptions and Cautions
- 12.5 Simulation Models
- 12.5.1 Simulation Results, TRM Fuse
- 12.5.2 Simulation Results, TRM Trace
- 12.5.3 Short-time Effects
- 12.5.4 Final Conclusions
- 12.6 Experimental Results:
- 12.6.1 Heating Uncertainties
- 12.6.2 Cooling Uncertainties
- 12.7 The Fusing Process
- 12.7.1 Strong Overload
- 12.7.2 Slight Overload
- 12.8 Experimental Results
- 12.8.1 Case A: Fast Fusing
- 12.8.2 Case B: Slow Fusing
- 12.8.3 Other Cases
- 12.9 Summary
- End Notes
- Chapter 13 Do Traces Heat Uniformly?
- 13.1 Bottom Line
- 13.2 Background
- 13.3 Thermal Gradients on Traces
- 13.3.1 Thermal Gradients on Narrow Trace
- 13.3.2 Does Trace Thickness Matter?
- 13.3.3 Is Trace Thickness Uniform?
- 13.3.4 What Causes Thermal Nonuniformity
- 13.3.5 Conclusion
- 13.4 Thermal Gradients Around Corners
- 13.4.1 Software Simulation
- 13.4.2 Experimental Verification
- 13.4.3 Conclusions
- End Notes
- Chapter 14 Stop Thinking about Current Density
- 14.1 Bottom Line
- 14.2 Background
- 14.3 Current Density Is Not an Independe
- 14.4 IPC Curves
- 14.5 Copper Type
- 14.6 Dielectric Type
- 14.7 Right-Angle Corners
- 14.8 Trace Form Factor
- 14.9 Via Current Densities
- 14.10 Conclusion
- Chapter 15 AC Currents
- 15.1 Bottom Line
- 15.2 Digital Simulation Models
- 15.2.1 Preliminary Results
- 15.3 Experimental Verification
- 15.3.1 Conclusions
- 15.4 Analog AC Currents
- 15.4.1 Test Circuit
- 15.4.2 RMS Signal Levels
- 15.4.3 Nonlinearities
- 15.4.4 Results
- 15.4.5 Conclusion
- End Notes
- Chapter 16 Industrial CT (X-Ray) Scanning
- 16.1 Bottom Line
- 16.2 Background
- 16.3 The Promise
- 16.4 The Microsectioning Process
- 16.5 Industrial CT Scanning
- 16.5.1 Results
- 16.6 Comparison of the Processes
- 16.7 Conclusion
- End Notes
- Appendix A Measuring Thermal Conductivity
- A.1 Measurement
- End Notes
- Appendix B Measuring Resistivity
- B.1 Resistance versus Resistivity
- B.2 How to Measure PCB Trace Resistivity
- B.3 Problem with Ohmmeter Measurement
- B.4 Sources of Measurement Error
- B.4.1 Trace Width
- B.4.2 Trace Length
- B.4.3 Trace Thickness
- B.4.4 Roughness
- B.5 An Experimental Study
- B.5.1 What Is Expected Resistivity?
- B.6 Summary
- End Notes
- Appendix C IPC Internal and Vacuum Curves Fitted wi
- Appdendix D Detailed Set of Equations for the Curves
- Appendix E Current/Temperature Curves, 0.25 to 5.0
- Appendix F Current Density in Vias
- F.1 Interpretations
- F.1.1 Caution
- F.1.2 Symmetry
- F.2 Single Via Model
- F.3 Single Via Model with Core 1 Broken
- F.4 Simulation of Four Vias, Proceeding
- F.5 Simulation of Four Vias, Traces at R
- Appendix G Derivation of Onderdonk's Equation
- G.1 Onderdonk's Equation
- G.2 Background
- G.2.1 Basic Equation
- G.2.2 Solving the Equation
- G.3 Proof that a * ? = ? * a
- End Notes
- Appendix H Results of All Six Fusing Configuration
- Appendix I Nonuniform Heating Patterns
- About the Authors
- Index
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