High Resolution X-Ray Diffractometry And Topography
Published on 5. February 1998
252 pages
978-0-203-97919-8 (ISBN)
Description
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
More details
Language
English
Place of publication
Baton Rouge
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
File size
14,27 MB
ISBN-13
978-0-203-97919-8 (9780203979198)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
D.K. Bowen | Brian K. Tanner
High Resolution X-Ray Diffractometry And Topography
Book
10/2019
1st Edition
CRC Press
€100.90
Shipment within 15-20 days
D.K. Bowen | Brian K. Tanner
High Resolution X-Ray Diffractometry And Topography
Book
02/1998
1st Edition
Taylor & Francis
€272.40
Shipment within 3-4 weeks
Persons
D. Keith Bowen, formerly Professor of Engineering at the University of Warwick, is President of Bede Scientific Inc., Denver, Colorado, USA, as well as Strategic Research Director of Bede Scientific Instruments Ltd. Brian K. Tanner is Professor of Physics and Head of the Department of Physics at the University of Durham, and Science Director of Bede Scientific Instruments Ltd., Durham.
Content
Preface, 1. Introduction: Diffraction Studies of Crystal Perfection, 2. High Resolution X-ray Diffraction Techniques, 3. Analysis of Epitaxial Layers, 4. X-ray Scattering Theory, 5. Simulation of X-ray Diffraction Rocking Curves, 6. Analysis of Thin Films and Multiple Layers, 7. Triple-axis X-ray Diffractometry, 8. Single-crystal X-ray Topography, 9. Double-crystal X-ray Topography, 10. Synchrotron Radiation Topography, Index
