Neutron and X-ray Reflectometry

The field of ultra-thin films, a subgroup of nanomaterials, has seen an upsurge in research within the last 30 years. Neutron and X-ray reflectivity are two important non-destructive techniques for investigation of depth dependent structure and magnetic properties of thin film hetero structures. The technique of polarized neutron reflectometry (PNR) is a unique non-destructive tool to understand thin film magnetism in mesoscopic length scale. Together with x-ray reflectometry (XRR) they are two major techniques in the field of thin films.

This book presents the principal of neutron and x-ray reflectivity and different modes of neutron reflectivity with many examples, where polarized neutron reflectivity has uniquely revealed the emerging phenomena at the interfaces.

The text discusses studies on alloy formation at interfaces in films with alternating metal and semiconductor layers, metallic layers of different properties like Ni and Al, magnetism at the interfaces of two ferromagnets, magnetism at the interface of a ferromagnet and magnetism at the interface of a ferromagnet and superconductor. This book demonstrates the important role of neutron (and x-ray) reflectivity measurements in understanding such properties. This reference text is helpful for students and institutions working in the field of interface magnetism in thin film and multilayers.