Transactions on Engineering Technologies
Description
This volume contains selected revised and extended research articles written by prominent researchers who participated in the International MultiConference of Engineers and Computer Scientists 2016, held in Hong Kong, 16-18 March 2016. Topics covered include engineering physics, communications systems, control theory, automation, engineering mathematics, scientific computing, electrical engineering, and industrial applications. The book showcases the tremendous advances in engineering technologies and applications, and also serves as an excellent reference work for researchers and graduate students working on engineering technologies, physical sciences and their applications.
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Dr. Sio-Iong Ao finished his doctoral research in The University of Hong Kong and postdoctoral researches in the University of Oxford and Harvard University and is a former visiting professor of Cranfield University, UK and University of Wyoming, USA.
Dr. Haeng-Kon Kim is currently a Dean of engineering college and a professor in the Department of Computer Engineering Catholic University of Daegu, in Korea. He has been a research staff member in Bell Lab. and NASA center in U.S.A. He has taught in Central Michigan Univ. in U.S.A. during his Sabbatical (Dec., 20, 2000 ~ Feb., 20,2002).
Prof. Xu Huang is professor and head of engineering in the Faculty of Information Sciences and Engineering, University of Canberra, Australia. Prof. Huang is Fellow of Institution of Engineers Australia (FIEAust).
Prof. Oscar Castillo is a Professor of Computer Science in the Graduate Division, Tijuana Institute of Technology, Tijuana, Mexico. Prof. Castillo serves as Research Director of Computer Science and head of the research group on fuzzy logic and genetic algorithms, and is President of HAFSA (Hispanic American Fuzzy Systems Association) and Vice-President of IFSA (International Fuzzy Systems Association). Prof. Castillo is also Vice-Chair of the Mexican Chapter of the Computational Intelligence Society (IEEE).
