Electron Microscopy
Principles and Fundamentals
1st Edition
Published on 26. September 2008
XII, 515 pages
978-3-527-61455-4 (ISBN)
Description
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.
Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
More details
Other editions
Additional editions
S. Amelinckx
Electron Microscopy - Principles and Fundamentals
Software
12/2007
Wiley-VCH
€289.61
No shipping information available
Book
10/1997
Wiley-VCH
€209.00
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Persons
S. Amelinckx, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium.
Dirk van Dyck, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium.
J. van Landuyt, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium.
Gustaaf van Tendeloo, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium.
Content
STATIONARY BEAM METHODS
Transmission Electron Microscopy
Reflection Electro Microscopy
Electron Energy Loss Spectroscopy
High-Voltage Electron Microscopy
Convergent Electron Beam Diffraction
Low Energy Electron Microscopy
Lorentz Microscopy
Electron holographic Methods
SCANNING BEAM METHODS
Scanning Reflection Electron Microscopy
Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy: Z-Contrast
Scanning Auger and XPS Microscopy
Scanning Microanalysis
Imaging Secondary Ion Mass Spectrometry
Transmission Electron Microscopy
Reflection Electro Microscopy
Electron Energy Loss Spectroscopy
High-Voltage Electron Microscopy
Convergent Electron Beam Diffraction
Low Energy Electron Microscopy
Lorentz Microscopy
Electron holographic Methods
SCANNING BEAM METHODS
Scanning Reflection Electron Microscopy
Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy: Z-Contrast
Scanning Auger and XPS Microscopy
Scanning Microanalysis
Imaging Secondary Ion Mass Spectrometry
