Advances in Surface Science
Academic Press
Published on 20. October 2001
454 pages
978-0-08-053139-7 (ISBN)
Description
Surface science has a wide range of applications that include semiconductor processing, catalysis, vacuum technology, microelectronics, flat-panel displays, compact disks, televisions, computers, environmental monitoring of pollutants, biomaterials, artificial joints, soft tissues, food safety, pharmacy, and many more.This volume is intended for upper-level undergraduate and graduate students in universities, individual research groups and researchers working on surfaces of materials. It is of interest to chemists, solid-state physists, materials scientists, surface chemists, polymer scientists, electrical engineers, chemical engineers, and everyone involved in materials science.
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10/2001
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Content
- Cover
- Contents
- Contributors
- Volumes in Series
- Preface
- Chapter 1. Surface Characterization: Composition Structure and Topography
- 1. Introduction
- 2. Ion Scattering Methods
- 3. Diffraction Methods
- 4. Electron Spectroscopy
- PART I. QUANTITATIVE ANALYSIS OF ELECTRON SPECTRA
- PART II. NANOSTRUCTURES OF SEMICONDUCTOR SYSTEMS
- 5. Scanning Probe Microscopy
- PART III. SCANNING TUNNELING MICROSCOPY
- PART IV. ATOMIC FORCE MICROSCOPY
- 6. Comparative Considerations
- References
- Chapter 2. Application of Photoelectron Spectroscopy in Inorganic and Organic Material Systems
- 1. Introduction
- 2. Fundamentals and a Brief History of ESCA
- 3. A Basic ESCA System
- 4. Information Available from ESCA
- 5. Binding Energy and Chemical Shift
- 6. Quantification
- 7. Application of ESCA in Oxides
- 8. Application of ESCA in Composite Systems
- 9. Key Silicate Analyses Using ESCA
- 10. ESCA in Selected Organic Systems
- 11. Conclusion
- References
- Chapter 3. Secondary Electron Fine Structure"a Method of Local Atomic Structure Characterization
- 1. Introduction
- 2. The Method of Obtaining the SEFS Experimental Data
- 3. Theoretical Description of the SEFS Process
- 4. Estimation of Amplitudes and Intensities of First- and Second-Order Processes
- 5. Description of the Characteristic Features of the SEFS Spectra of the Secondary Electrons
- 6. Analysis of the Surface Local Atomic Structure by the SEFS Method
- 7. Conclusion
- Acknowledgments
- References
- Chapter 4. Photonic and Electronic Spectroscopies for the Characterization of Organic Surfaces and Organic Molecules Adsorbed on surfaces
- 1. Introduction
- 2. Diffuse Reflectance Techniques for Surface Photochemistry Studies
- 3. Electronic Spectroscopies
- 4. Examples of Systems Studied by Electronic and Photonic Spectroscopies
- 5. Combined Studies Involving Photonic and Electronic Spectroscopies
- 6. Conclusions
- Acknowledgments
- References
- Chapter 5. High-Pressure Surface Science
- 1. Introduction
- 2. Phase Transformations in Materials Under Static Contact Loading
- 3. Phase Transformations in Materials Under Dynamic Contact Loading
- 4. Conclusions
- References
- Index
