Advances in Optics of Charged Particle Analyzers: Part 2
Elsevier (Publisher)
Published on 10. February 2025
232 pages
978-0-443-31721-7 (ISBN)
Description
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more
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Other editions
Additional editions
Book
05/2025
Academic Press
€209.22
Shipment within 15-20 days
Persons
Content
Prefece1. Electrostatic Energy AnalyzersMikhail Yavor2. Mass Analyzers With Combined Electrostatic and Magnetic FieldsMikhail Yavor3. Mass Analyzers based on Fourier TransformMikhail Yavor4. Principles of Time-of-Flight Mass AnalyzersMikhail Yavor5. Multi-Pass Time-of-Flight Mass AnalyzersMikhail Yavor6. Radiofrequency Mass AnalyzersMikhail Yavor
