Advances in Imaging and Electron Physics
Silicon-Based Millimetre-wave Technology
Academic Press
Published on 1. November 2012
484 pages
978-0-12-394636-2 (ISBN)
Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
More details
Other editions
Additional editions
Jamal Deen
Advances in Imaging and Electron Physics: Volume 174
Silicon-Based Millimetre-wave Technology
Book
12/2012
Academic Press
€210.46
Shipment within 15-20 days
Person
Content
- Measurement Techniques and Practical Issues
Jamal Deen
- Transmission lines and passive components
Guennadi A. Kouzaev
- Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
Mohamed Bakr
- Field-effect types of transistors
Benjamin Iniguez
- RF MEMS Switches and Switch Matrices
Mojgan Daneshmand
- Substrate-Integrated Antennas on Silicon
Natalia K. Nikolova
