
Advances in Imaging and Electron Physics
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Content
- Front Cover
- Advances in Imaging and Electron Physics, Volume 110
- Copyright Page
- CONTENTS
- Contributors
- Preface
- Forthcoming Contributors
- Chapter 1. Interference Scanning Optical Probe Microscopy: Principles and Applications
- I. Introduction: Wave Optical Properties Near Surfaces
- II. Outline
- III. The Microscopic Perspective of Light-Matter Interaction: Wave Scattering
- IV. Formation of Standing Waves: Propagative and Nonpropagative Waves
- V. Imaging of Standing Waves: Shadow Formation and Detection through Probe Edge
- VI. Quantum Limit in Near-Field Imaging: Short versus Intermediate Distance Observation
- VII. Near-Field Holography: Amplitude and Phase Information
- VIII. Experimental Results
- IX. Concluding Remarks
- Chapter 2. High-speed Electron Microscopy
- I. Introduction
- II. High-Speed Techniques
- III. Time-Resolving Microscopes
- IV. Concluding Remarks
- Acknowledgments
- References
- Chapter 3. Soft Mathematical Morphology: Extensions, Algorithms, and Implementations
- I. Introduction
- II. Standard Mathematical Morphology
- III. Soft Mathematical Morphology
- IV. Soft Morphological Structuring Element Decomposition
- V. Fuzzy Soft Mathematical Morphology
- VI. Implementations
- VII. Concluding Remarks
- References
- Chapter 4. Difference in the Aharonov-Bohm Effect on Scattering States and Bound States
- I. Introduction
- II. AB Effect on Scattering States
- III. AB Effect on Bound States
- IV. AB Effect on a System of Both Bound States and Scattering States
- V. Gauge Invariance and Scattering Theory
- VI. Concluding Remarks
- Acknowledgments
- Index
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