
Advanced Characterization Techniques for Thin Film Solar Cells
Description
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research and development. After an introduction to thin-fi lm photovoltaics, renowned experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are
used for ab-initio calculations of relevant semiconductors and for device simulations in one, two, and three dimensions.
Building on a proven concept, this new edition also covers transient optoelectronic methods, absorption and photocurrent spectroscopy, in-situ realtime characterization of thin-fi lm growth, as well as simulations based on molecular dynamics.
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Persons
Thomas Kirchartz is professor in the Department of Electrical Engineering and Information
Technology at the University Duisburg-Essen and head of the Division for Organic and Hybrid Solar Cells at the Institute of Energy and Climate Research 5 ? Photovoltaics at the Research Center Jülich, Germany. Previously he was Junior Research Fellow in the Department of Physics at Imperial College London, UK. He obtained his degree in Electrical Engineering and Information Technology from the University of Stuttgart, Germany, in 2006 and his PhD from the RWTH Aachen, Germany, in 2009.
Uwe Rau is full professor at the Faculty Electrical Engineering and Computer Science of the RWTH Aachen, Germany, since 2007 and head of the Institute of Energy and Climate Research 5 ? Photovoltaics at the Research Center Jülich, Germany. He obtained his PhD 1991 from the University Tübingen and was scientific group leader from 1995?2007 at the Universities of Bayreuth and Stuttgart.
Content
INTRODUCTION
Introduction to Thin-Film Photovoltaics
DEVICE CHARACTERIZATION
Fundamental Electrical Characterization of Thin-Film Solar Cells
Electroluminescence Analysis of Solar Cells and Solar Modules
Capacitance Spectroscopy of Thin-Film Solar Cells
Time-of-Flight Analysis
Transient Optoelectronic Characterization of Thin-Film Solar Cells
Steady-State Photocarrier GratingMethod
MATERIALS CHARACTERIZATION
Absorption and Photocurrent Spectroscopy with High Dynamic Range
Spectroscopic Ellipsometry
Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field OpticalMicroscopy
Photoluminescence Analysis of Thin-Film Solar Cells
Electron-Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a-Si:H)
Scanning ProbeMicroscopy on Inorganic Thin Films for Solar Cells
Electron Microscopy on Thin Films for Solar Cells
X-ray and Neutron Diffraction on Materials for Thin-Film Solar Cells
Volume 2
In Situ Real-Time Characterization of Thin-Film Growth
Raman Spectroscopy on Thin Films for Solar Cells
Soft X-ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces
Accessing Elemental Distributions in Thin Films for Solar Cells
Hydrogen Effusion Experiments
MATERIALS AND DEVICE MODELING
Ab Initio Modeling of Defects in Semiconductors
Molecular Dynamics Analysis of Nanostructures
One-Dimensional Electro-Optical Simulations of Thin-Film Solar Cells
Two- and Three-Dimensional ElectronicModeling of Thin-Film Solar Cells
Index
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