
Advances and Challenges in Chemical Mechanical Planarization: Volume 991
Volume 991
Cambridge University Press
Published on 5. June 2014
Book
Paperback/Softback
388 pages
978-1-107-40870-8 (ISBN)
Description
Chemical mechanical planarization (CMP) has been a leading-edge technology in semiconductor processing for the past 15?20 years. A successful CMP process is based in fundamental science across the disciplines of mechanical engineering, chemical engineering, colloid science, materials science and chemistry. Traditionally, the MRS Spring Meeting serves as a nexus for multidisciplinary interaction and discussion between CMP researchers in both industry and academia. The papers in this book are from the 2007 MRS Spring Meeting and address the fluid and wear mechanics that occur when using CMP tools and pad/slurry consumables, as well as the surface mechanisms required for effective post-CMP cleaning. It also focuses on new successes and challenges in technologies such as electrochemical mechanical planarization (eCMP), three-dimensional integration and advanced CMP process modeling and control strategies.
More details
Series
Language
English
Place of publication
Cambridge
United Kingdom
Target group
College/higher education
Professional and scholarly
Product notice
Paperback (trade)
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 20 mm
Weight
520 gr
ISBN-13
978-1-107-40870-8 (9781107408708)
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Schweitzer Classification
Other editions
Additional editions

Gerfried Zwicker | Christopher Borst | Laertis Economikos
Advances and Challenges in Chemical Mechanical Planarization: Volume 991
Book
11/2007
Materials Research Society
€57.13
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Persons
Editor
University at Albany, State University of New York
University of Arizona