Progress in Transmission Electron Microscopy 1
Concepts and Techniques
Published on 1. December 2010
Book
Paperback/Softback
XVI, 367 pages
978-3-642-08717-2 (ISBN)
Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
More details
Series
Edition
Softcover reprint of hardcover 1st ed. 2001
Language
English
Place of publication
Berlin
Germany
Publishing group
Springer Berlin
Target group
Professional and scholarly
Research
Illustrations
XVI, 367 p.
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
593 gr
ISBN-13
978-3-642-08717-2 (9783642087172)
DOI
10.1007/978-3-662-09518-8
Schweitzer Classification
Other editions
Additional editions
Book
10/2001
Springer
€160.49
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Content
1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.