Wafer Level Reliability of Advanced CMOS Devices & Processes
Published on 26. November 2008
Book
Hardback
195 pages
978-1-60456-713-7 (ISBN)
More details
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Illustrations
Illustrations
Dimensions
Height: 180 mm
Width: 260 mm
Weight
608 gr
ISBN-13
978-1-60456-713-7 (9781604567137)
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Schweitzer Classification