
Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
Springer (Publisher)
Published on 3. August 2006
Book
Paperback/Softback
XXI, 939 pages
978-3-540-37236-3 (ISBN)
Description
This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.
More details
Series
Edition
2006 ed.
Language
English
Place of publication
Berlin
Germany
Publishing group
Springer Berlin
Target group
Professional and scholarly
Research
Illustrations
XXI, 939 p.
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
1431 gr
ISBN-13
978-3-540-37236-3 (9783540372363)
DOI
10.1007/11815921
Schweitzer Classification
Content
Invited Talks.- SSPR.- Poster Papers.- SPR.- Poster Papers.