Cover: Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors - Springer

Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors

Shijie Xu(Editor)
Springer (Publisher)
Will be published approx. on 11. January 2026
Book
Hardback
XII, 373 pages
978-981-95-1927-9 (ISBN)
€192.59incl. 7% vat
Not yet published

Description

More details

Other editions

Person

Content